C
C. Cui
Researcher at Lawrence Berkeley National Laboratory
Publications - 10
Citations - 1442
C. Cui is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Diffraction & Resolution (electron density). The author has an hindex of 8, co-authored 10 publications receiving 1337 citations.
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Journal ArticleDOI
High-resolution ab initio three-dimensional x-ray diffraction microscopy
Henry N. Chapman,Anton Barty,Stefano Marchesini,Aleksandr Noy,Stefan P. Hau-Riege,C. Cui,Malcolm R. Howells,R. Rosen,H. He,John C. H. Spence,Uwe Weierstall,T. Beetz,Chris Jacobsen,David A. Shapiro +13 more
TL;DR: In this article, the authors demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images, using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object.
Journal ArticleDOI
An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy
Malcolm R. Howells,T. Beetz,Henry N. Chapman,C. Cui,James M. Holton,James M. Holton,Chris Jacobsen,Chris Jacobsen,Janos Kirz,Janos Kirz,E. Lima,Stefano Marchesini,H. Miao,David Sayre,David A. Shapiro,John C. H. Spence,John C. H. Spence,D. Starodub +17 more
TL;DR: The conclusion of this study is that, based on the natural contrast between protein and water and "Rose-criterion" image quality, one should be able to image a frozen-hydrated biological sample using XDM at a resolution of about 10 nm.
Journal ArticleDOI
Massively parallel X-ray holography
Stefano Marchesini,Stefano Marchesini,Sébastien Boutet,Sébastien Boutet,Anne Sakdinawat,Michael J. Bogan,Saša Bajt,Anton Barty,Henry N. Chapman,Matthias Frank,Stefan P. Hau-Riege,Abraham Szöke,C. Cui,David A. Shapiro,Malcolm R. Howells,John C. H. Spence,Joshua W. Shaevitz,Joanna Y. Lee,Janos Hajdu,Janos Hajdu,M. Marvin Seibert +20 more
TL;DR: In this paper, a uniformly redundant array placed next to the sample, multiplies the efficiency of X-ray Fourier transform holography by more than three orders of magnitude, approaching that of a perfect lens, and provides holographic images with both amplitude and phase contrast information.
Journal ArticleDOI
Three-Dimensional Coherent X-Ray Diffraction Imaging of a Ceramic Nanofoam: Determination of Structural Deformation Mechanisms
Anton Barty,Stefano Marchesini,Stefano Marchesini,Stefano Marchesini,Henry N. Chapman,Henry N. Chapman,C. Cui,Malcolm R. Howells,David A. Shapiro,Andrew M. Minor,John C. H. Spence,Uwe Weierstall,Jan Ilavsky,Aleksandr Noy,Stefan P. Hau-Riege,Alexander B. Artyukhin,Theodore F. Baumann,Trevor M. Willey,James S. Stolken,T. van Buuren,John H. Kinney +20 more
TL;DR: Finite-element analysis from the structure of the labrynthine internal structure of a tantalum oxide nanofoam reveals mechanical properties consistent with bulk samples and with a diffusion-limited cluster aggregation model, while excess mass on the nodes discounts the dangling fragments hypothesis of percolation theory.
Journal Article
High-resolution ab initio three-dimensional x-ray diffraction microscopy
Henry N. Chapman,Anton Barty,Stefano Marchesini,Aleksandr Noy,Stefan P. Hau-Riege,C. Cui,Malcolm R. Howells,R. Rosen,H. He,John C. H. Spence,Uwe Weierstall,T. Beetz,Chris Jacobsen,David A. Shapiro +13 more
TL;DR: X-ray diffraction imaging with high resolution in all three dimensions is demonstrated, as determined by a quantitative analysis of the reconstructed volume images, and the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources are established.