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V. Elings

Researcher at Veeco

Publications -  33
Citations -  6969

V. Elings is an academic researcher from Veeco. The author has contributed to research in topics: Conductive atomic force microscopy & Magnetic force microscope. The author has an hindex of 23, co-authored 33 publications receiving 6766 citations.

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Reproducible Imaging and Dissection of Plasmid DNA Under Liquid with the Atomic Force Microscope

TL;DR: Reproducible images of uncoated DNA in the atomic force microscope (AFM) have been obtained by imaging plasmid DNA on mica in n-propanol by increasing the force applied by the AFM tip at selected locations.
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Using force modulation to image surface elasticities with the atomic force microscope

TL;DR: In this paper, a new contrast mechanism relies on variation in the surface elasticity of a carbon fiber and epoxy composite is used to reveal contrast between the two materials, and a lateral modulation mode is employed to highlight atomic steps in gold.
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Atomic-Resolution Electrochemistry with the Atomic Force Microscope: Copper Deposition on Gold

TL;DR: The atomic force microscope (AFM) was used to image an electrode surface at atomic resolution while the electrode was under potential control in a fluid electrolyte and revealed that the underpotential-deposited monolayer has different structures in different electrolytes.
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How to measure energy dissipation in dynamic mode atomic force microscopy

TL;DR: In this article, the energy dissipated by the tip-sample interaction was measured by measuring such quantities as oscillation amplitude, frequency, phase shift and drive amplitude, which is applicable to a variety of scanning probe microscopes operating in different dynamic modes.
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Near-field photolithography with a solid immersion lens

TL;DR: In this article, a solid immersion lens (SIL) was used to focus a laser beam (λ =442 nm) in a photoresist, which was mounted on a flexible cantilever and scanned by a modified commercial atomic force microscope.