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V. Verzilov

Researcher at Istituto Nazionale di Fisica Nucleare

Publications -  11
Citations -  919

V. Verzilov is an academic researcher from Istituto Nazionale di Fisica Nucleare. The author has contributed to research in topics: Transition radiation & Diffraction. The author has an hindex of 7, co-authored 9 publications receiving 872 citations.

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First observation of self-amplified spontaneous emission in a free-electron laser at 109 nm wavelength

J. Andruszkow, +144 more
TL;DR: The first observation of self-amplified spontaneous emission (SASE) in a free-electron laser (FEL) in the vacuum ultraviolet regime at 109 nm wavelength is presented.
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Generation of GW radiation pulses from a VUV free-electron laser operating in the femtosecond regime.

TL;DR: The generation of ultrashort radiation pulses became possible due to specific tailoring of the bunch charge distribution and a complete characterization of the linear and nonlinear modes of the SASE FEL operation was performed.
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A new powerful source for coherent VUV radiation: Demonstration of exponential growth and saturation at the TTF free-electron laser

TL;DR: In this article, the authors present experimental evidence that the free-electron laser at the TESLA Test Facility has reached the maximum power gain of 107 in the vacuum ultraviolet (VUV) region at wavelengths between 80 and 120 nm.
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Measurements of coherent diffraction radiation and its application for bunch length diagnostics in particle accelerators.

TL;DR: No noticeable difference in the estimated bunch length was observed using diffraction radiation in a wide range of slit widths and transition radiation, as well as with the transition radiation case and theoretical predictions.
Journal ArticleDOI

Spatial resolution in optical transition radiation beam diagnostics

TL;DR: In this article, an evaluation of the optical transition radiation (OTR) single particle image dimension is obtained using diffraction theory based on a realistic description of the radiation source, which allows the analysis of the effect of the finite size of the emitting screen and of the imaging system.