V
Ville Miikkulainen
Researcher at University of Helsinki
Publications - 34
Citations - 2068
Ville Miikkulainen is an academic researcher from University of Helsinki. The author has contributed to research in topics: Atomic layer deposition & Thin film. The author has an hindex of 15, co-authored 33 publications receiving 1685 citations. Previous affiliations of Ville Miikkulainen include University of Eastern Finland & Aalto University.
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Journal ArticleDOI
Crystallinity of inorganic films grown by atomic layer deposition: Overview and general trends
TL;DR: Puurunen et al. as discussed by the authors summarized the two-reactant ALD processes to grow inorganic materials developed to-date, updating the information of an earlier review on ALD.
Journal ArticleDOI
Crystallinity of Inorganic Films Grown by Atomic Layer Deposition: Overview and General Trends
TL;DR: Puurunen et al. as discussed by the authors summarized the two-reactant ALD processes to grow inorganic materials developed to-date, updating the information of an earlier review on ALD.
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Atomic Layer Deposition of Spinel Lithium Manganese Oxide by Film-Body-Controlled Lithium Incorporation for Thin-Film Lithium-Ion Batteries
Ville Miikkulainen,Amund Ruud,Erik Østreng,Ola Nilsen,Mikko Laitinen,Timo Sajavaara,Helmer Fjellvåg +6 more
TL;DR: In this article, the authors demonstrate the ALD of lithium manganese oxide, LixMn2O4, from Mn(thd)3, Li (thd), and ozone.
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Effect of corona pre-treatment on the performance of gas barrier layers applied by atomic layer deposition onto polymer-coated paperboard
Terhi Hirvikorpi,Mika Vähä-Nissi,Ali Harlin,Jaana Marles,Ville Miikkulainen,Maarit Karppinen +5 more
TL;DR: In this article, the effect of heat treatment on the gas bar-rier of the polymer-coated board further coated with an Al2O3 layer by atomic layer deposition (ALD) was studied.
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Controlling the crystallinity and roughness of atomic layer deposited titanium dioxide films.
Riikka L. Puurunen,Timo Sajavaara,Eero Santala,Ville Miikkulainen,Tapio Saukkonen,Mikko Laitinen,Markku Leskelä +6 more
TL;DR: The surface roughness of thin films is an important parameter related to the sticking behaviour of surfaces in the manufacturing of microelectomechanical systems (MEMS) and makes the TiO2 films candidates for adhesion engineering in MEMS.