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Xiao Liu
Researcher at United States Naval Research Laboratory
Publications - 94
Citations - 2001
Xiao Liu is an academic researcher from United States Naval Research Laboratory. The author has contributed to research in topics: Amorphous solid & Amorphous silicon. The author has an hindex of 20, co-authored 93 publications receiving 1820 citations. Previous affiliations of Xiao Liu include Cornell University & Karlsruhe Institute of Technology.
Papers
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Journal ArticleDOI
Low-temperature thermal conductivity and acoustic attenuation in amorphous solids
TL;DR: In this article, all measurements published on the low-temperature thermal conductivity and acoustic attenuation in amorphous solids have been reviewed, on a total of over 60 different compositions.
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Amorphous Solid without Low Energy Excitations
Xiao Liu,B. E. White,Robert O. Pohl,E. Iwanizcko,Kim M. Jones,A. H. Mahan,B. N. Nelson,Richard S. Crandall,Stan Veprek +8 more
TL;DR: In this article, the authors measured the low temperature internal friction (Q{sup -1}) of amorphous silicon (a-Si) films without any significant low energy excitations.
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Shear Modulus of Monolayer Graphene Prepared by Chemical Vapor Deposition
TL;DR: Measurements of shear modulus and internal friction of large-area monolayer graphene films grown by chemical vapor deposition on copper foil and transferred onto high-Q silicon mechanical oscillators show that the shear restoring force transitions from interlayer to intralayer interactions as the film thickness approaches one monolayers.
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Thermoelastic loss in microscale oscillators
TL;DR: In this article, a simple model of thermoelastic dissipation is proposed for general, free standing microelectromechanical (MEMS) and nanoelectromeechanical oscillators, which defines a flexural modal participation factor, the fraction of potential energy stored in flexure.
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Hydrogen-free amorphous silicon with no tunneling states.
TL;DR: In this paper, the authors show that the enhanced surface energetics at a high growth temperature improved the amorphous structural network of e-beam a-Si and removed TLSs.