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Xide Li
Researcher at Tsinghua University
Publications - 41
Citations - 695
Xide Li is an academic researcher from Tsinghua University. The author has contributed to research in topics: Electronic speckle pattern interferometry & Speckle pattern. The author has an hindex of 15, co-authored 37 publications receiving 616 citations. Previous affiliations of Xide Li include University of Science and Technology of China & National Tsing Hua University.
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Surface effects on the elastic modulus of nanoporous materials
TL;DR: In this article, a unit-cell micromechanics model is presented to predict the effective Young's modulus of open-cell nanoporous materials, incorporating the effects of surface energy and residual surface stress on the effective elastic property of nanoporous material.
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In-situ SEM investigation on fatigue behaviors of additive manufactured Al-Si10-Mg alloy at elevated temperature
TL;DR: In this paper, in-situ tensile fatigue experiments under SEM environment at room temperature and elevated temperature are performed for studying the fatigue performance and crack propagation process of selective laser melting (SLM) additive manufactured Al-Si10-Mg materials.
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Tomographic reconstruction of transient acoustic fields recorded by pulsed TV holography
Per Gren,Staffan Schedin,Xide Li +2 more
TL;DR: Pulsed TV holography combined with computerized tomography (CT) are used to evaluate the three-dimensional distribution of transient acoustic fields in air and phase maps, representing projections of the acoustic field are evaluated quantitatively from the recorded holograms.
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Surface effects on the mechanical properties of nanoporous materials
TL;DR: The results reveal that both the elastic modulus and the critical buckling behavior of nanoporous materials exhibit a distinct dependence on the characteristic sizes of microstructures, e.g. the average ligament width.
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Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry
Xide Li,Gang Tao,Yizhang Yang +2 more
TL;DR: In this article, two methods, scanning phase method and time sequence phase method, have been introduced for measuring the displacement caused by the deformation in temporal speckle pattern interferometry (TSPI), and experiments are performed to demonstrate their performance with a conventional ESPI system.