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Yang Liu
Researcher at University of Electronic Science and Technology of China
Publications - 83
Citations - 870
Yang Liu is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Terahertz radiation & Microstrip. The author has an hindex of 12, co-authored 83 publications receiving 635 citations. Previous affiliations of Yang Liu include University of Hong Kong & Nanyang Technological University.
Papers
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An energy-efficient deep convolutional neural networks coprocessor for multi-object detection
Yuancong Wu,J. J. Wang,Qian Kun,Yong Liu,Rui Guo,S. G. Hu,Qi Yu,Tupei Chen,Yang Liu,Rong Limei +9 more
TL;DR: An energy-efficient deep convolution neural networks coprocessor architecture for multi-object detection applications based on deep learning algorithms that can support both convolutional layers and fully connected layers to accelerate various mobiledeep learning algorithms.
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3–10 GHz ultra‐wideband LNA with continuously variable gain for wireless communication
TL;DR: In this article, a two-stage low-noise amplifier (LNA) with continuously variable gain for 3-10 GHz ultra-wideband (UWB) application has been realized in 65 nm CMOS technology.
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Small signal modeling of AlGaN/GaN HEMTs with consideration of CPW capacitances*
TL;DR: In this article, a small-signal equivalent circuit model considering coplanar waveguide capacitance is provided, and a good agreement is observed between the simulation and measurement results, indicating the reliability of the model.
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Self‐calibrated SAR ADC based on split capacitor DAC without the use of fractional‐value capacitor
TL;DR: In this paper, a successive approximation register analog-to-digital converter (SAR ADC) based on a split-capacitor DAC with a split binary weighted capacitor array and C-2C ladder is proposed.
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W/Cu thin film infrared reflector for TiNxOy based selective solar absorber with high thermal stability
TL;DR: In this paper, the structural, chemical, and optical properties of the SSA layers that experienced thermal annealing at different temperatures for various durations have been investigated with the characterization techniques, including X-ray photoelectron spectroscopy, Xray diffraction, atomic force microscopy, spectroscopic ellipsometry, and spectrophotometry.