Yasuhisa Sano

TL;DR: In this paper, the authors developed a highly accurate differential deposition system for the fabrication of X-ray optical devices with sub-nanometer accuracy, using a Pt thin film having a thickness distribution gradually changing along the longitudinal direction on a substrate surface.

TL;DR: In this article, a relative angle determinable stitching interferometry (RADSI) method was proposed for hard x-ray nanofocusing mirrors, which consists of a microscope Michelson interferometer, and a large-area Fizeau interferer.

TL;DR: In this article, a scanning X-ray fluorescence microscope (SXFM) using Kirkpatrick-Baez mirror optics, which enables achromatic and highly efficient focusing, at BL29XUL of SPring-8.

TL;DR: In this article, the authors describe the design of the graded multilayer mirror and evaluation method for hard X-ray focused beam, which is one of the most promising methods for producing nanofocused X-rays due to its high efficiency and beams size.

TL;DR: In this article, the authors performed figure correction of an elliptically figured mirror by a differential deposition technique on the basis of the wavefront phase error, which was calculated by a phase-retrieval method using only intensity profile on the focal plane.