Y
Yasunori Taga
Researcher at Toyota
Publications - 291
Citations - 11079
Yasunori Taga is an academic researcher from Toyota. The author has contributed to research in topics: Thin film & Layer (electronics). The author has an hindex of 51, co-authored 291 publications receiving 10803 citations. Previous affiliations of Yasunori Taga include Nagoya University & Denso.
Papers
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Journal ArticleDOI
Chemical Structure of Aluminum/8-Hydroxyquinoline Aluminum Interface.
TL;DR: In this paper, the chemical structure of interfaces between aluminum and 8-hydroxyquinoline aluminum (Alq3) has been studied by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS).
Journal ArticleDOI
Material Developments and Light Control in Organic Light-Emitting Diode
Shizuo Tokito,Yasunori Taga +1 more
TL;DR: In this article, the influence of organic materials on the thermal stability and emission efficiency of organic light-emitting diode (OLED) was reported, and several hole transporting materials and emitting materials were developed based on triphenylamine and metal-chelate complex, respectively.
Patent
Amine compound and uses thereof
Makoto Fujiwara,Natsuko Sonoda,Makoto Satsuki,Sadaharu Suga,Hisayoshi Fujikawa,Koji Noda,Yasunori Taga +6 more
TL;DR: In this paper, an aromatic tertiary amine compound bearing within the same molecule one or more specific atomic groups and a luminescent agent directed to use in organic electroluminescent devices comprising it, as well as its uses are presented.
Patent
Ceramic substrate having a metallic layer thereon and a process for manufacturing the same
TL;DR: In this paper, an intermediate layer is formed between the ceramic substrate and the metallic layer, and subjecting the laminated substance to a heat treatment to cause a reaction between alumina and at least one of titanium (Ti), zirconium (Zr), and niobium (Nb) contained in the intermediate layer.
Journal ArticleDOI
Effect of H2O partial pressure and temperature during Ti sputtering on texture and electromigration in AlSiCu/Ti/TiN/Ti metallization
TL;DR: In this paper, the effect of residual gas constituents and substrate temperature during Ti sputtering on the texture of TiN/Ti films deposited on SiO2/Si substrates has been investigated.