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Yongchang Wang

Researcher at University of Kentucky

Publications -  11
Citations -  874

Yongchang Wang is an academic researcher from University of Kentucky. The author has contributed to research in topics: Structured light & Fingerprint recognition. The author has an hindex of 10, co-authored 11 publications receiving 779 citations.

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Journal ArticleDOI

Dual-frequency pattern scheme for high-speed 3-D shape measurement.

TL;DR: A novel dual-frequency pattern is developed which combines a high-frequency sinusoid component with a unit- frequencies component, where the high- frequencies are used to generate robust phase information, and the unit-frequency component is used to reduce phase unwrapping ambiguities.
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Gamma model and its analysis for phase measuring profilometry

TL;DR: A mathematical model is developed for predicting the effects of nonunitary gamma on phase measuring profilometry, while also introducing an accurate gamma calibration method and two strategies for minimizing gamma's effect on phase determination.
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Data Acquisition and Processing of 3-D Fingerprints

TL;DR: A noncontact fingerprint scanner employing structured light illumination to generate high-resolution albedo images as well as 3-D ridge scans is introduced to solve the problems associated with conventional 2-D fingerprint scanners such as skin deformation and print smearing.
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Period Coded Phase Shifting Strategy for Real–time 3-D Structured Light Illumination

TL;DR: The proposed process for embedding a period cue into the projected pattern set without reducing the signal-to-noise ratio can unwrap high frequency phase and achieve high measurement precision without increasing the pattern number.
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Robust Active Stereo Vision Using Kullback-Leibler Divergence

TL;DR: A hybrid 3D reconstruction framework that supplements projected pattern correspondence matching with texture information is presented that reduces measurement errors versus traditional structured light and phase matching methodologies while being insensitive to gamma distortion, projector flickering, and secondary reflections.