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Yuh-Sheng Jean

Researcher at National Chiao Tung University

Publications -  2
Citations -  77

Yuh-Sheng Jean is an academic researcher from National Chiao Tung University. The author has contributed to research in topics: MOSFET & Drain-induced barrier lowering. The author has an hindex of 2, co-authored 2 publications receiving 76 citations.

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The threshold-voltage model of MOSFET devices with localized interface charge

TL;DR: In this article, a new analytic threshold-voltage model for a MOSFET device with localized interface charges is presented, which is verified that the model accurately predicts the threshold voltage for both fresh and damaged devices.
Journal ArticleDOI

A new extraction algorithm for the metallurgical channel length of conventional and LDD MOSFETs

TL;DR: In this article, a new method for the metallurgical channel length of conventional and LDD MOSFETs is presented, which is based on the well-known resistance method with a special technique to eliminate the uncertainty of the channel length and to reduce the influence of the parasitic source/drain resistance on threshold voltage determination.