An object is to provide a semiconductor device of which a manufacturing process is not complicated and by which cost can be suppressed, by forming a thin film transistor using an oxide semiconductor film typified by zinc oxide, and a manufacturing method thereof. For the semiconductor device, a gate electrode is formed over a substrate; a gate insulating film is formed covering the gate electrode; an oxide semiconductor film is formed over the gate insulating film; and a first conductive film and a second conductive film are formed over the oxide semiconductor film. The oxide semiconductor film has at least a crystallized region in a channel region.

Semiconductor device, and manufacturing method thereof

Nanocomposite photovoltaic devices are provided that generally include semiconductor nanocrystals as at least a portion of a photoactive layer. Photovoltaic devices and other layered devices that comprise core-shell nanostructures and/or two populations of nanostructures, where the nanostructures are not necessarily part of a nanocomposite, are also features of the invention. Varied architectures for such devices are also provided including flexible and rigid architectures, planar and non-planar architectures and the like, as are systems incorporating such devices, and methods and systems for fabricating such devices. Compositions comprising two populations of nanostructures of different materials are also a feature of the invention.

Nanostructure and nanocomposite based compositions and photovoltaic devices

This invention discloses a customizable logic array including an array of programmable cells having a multiplicity of inputs and a multiplicity of outputs; and customized interconnections providing permanent direct interconnections among at least a plurality of the multiplicity of inputs and at least a plurality of the multiplicity of outputs.

Customizable and programmable cell array

A system includes a semiconductor device. The semiconductor device includes a first single crystal silicon layer comprising first transistors, first alignment marks, and at least one metal layer overlying the first single crystal silicon layer, wherein the at least one metal layer comprises copper or aluminum more than other materials; and a second single crystal silicon layer overlying the at least one metal layer. The second single crystal silicon layer comprises a plurality of second transistors arranged in substantially parallel bands. Each of a plurality of the bands comprises a portion of the second transistors along an axis in a repeating pattern.

System comprising a semiconductor device and structure

A device comprising semiconductor memories, the device comprising: a first layer and a second layer of layer-transferred mono-crystallized silicon, wherein the first layer comprises a first plurality of horizontally-oriented transistors; wherein the second layer comprises a second plurality of horizontally-oriented transistors; and wherein the second plurality of horizontally-oriented transistors overlays the first plurality of horizontally-oriented transistors.

Semiconductor device and structure

A method for producing a 3D memory device, the method including: providing a first level including a first single crystal layer; forming at least one second level above the first level; performing a first etch step including etching holes within the second level; forming at least one third level above the at least one second level; performing a second etch step including etching holes within the third level; performing additional processing steps to form a plurality of first memory cells within the second level and a plurality of second memory cells within the third level; and performing a bonding of a fourth level above the third level, where the fourth level includes a second single crystal layer, where each of the first memory cells include one first transistor, where each of the second memory cells include one second transistor, where at least one of the first or second transistors has a channel, a source and a drain having a same doping type.

Methods for producing a 3D semiconductor memory device and structure

A method for producing a 3D memory device including: providing a first level including a single crystal layer; forming at least one second level above the first level; performing a first etch step including etching holes within the second level; forming at least one third level above the at least one second level; performing a second etch step including etching holes within the third level; performing additional processing steps to form memory cells within the second level and within the third level, each of the first memory cells include one first transistor, each of the second memory cells include one second transistor, where at least one of the first or second transistors has a channel, a source and a drain having the same doping type, the memory is NAND, the first level includes memory peripheral circuits, at least one of the first memory cells is at least partially atop a portion of the peripheral circuits.

Method for producing a 3d memory device

A 3D semiconductor device, the device including: first transistors; second transistors, overlaying the first transistors; third transistors, overlaying the second transistors; and fourth transistors, overlaying the third transistors, where the second transistors, the third transistors and the fourth transistors are self-aligned, being processed following the same lithography step, and where at least one of the first transistors is part of a control circuit controlling at least one of the second transistors, at least one of the third transistors and at least one of the fourth transistors.

3D IC semiconductor device and structure with stacked memory

A 3D semiconductor device, the device including: a first level including single crystal first transistors, where the first level is overlaid by a first isolation layer; a second level including second transistors, where the first isolation layer is overlaid by the second level, and where the second level is overlaid by a second isolation layer; a third level including single crystal third transistors, where the second isolation layer is overlaid by the third level, where the third level is overlaid by a third isolation layer, and where the first isolation layer and the second isolation layer are separated by a distance of less than four microns.

3D semiconductor device with isolation layers

La presente invention concerne un procede de fabrication de dispositif a semi-conducteurs, comprenant une premiere plaquette, constituee d'une premiere couche monocristalline comprenant des premiers transistors, des premiers marqueurs d'alignement, et des couches d'interconnexion des premiers transistors comprenant au moins une couche metallique recouvrant ladite premiere couche de silicium monocristallin, ladite ou lesdites couches metalliques etant constituees de cuivre ou d'aluminium. Le procede comprend les etapes suivantes : implantation et activation a haute temperature pour former une couche conductrice dans une seconde plaquette; formation d'une seconde couche cristallisee au-dessus de ladite premiere plaquette par transfert de ladite couche conductrice en utilisant un procede a coupure ionique; et formation de seconds transistors sur ladite seconde couche cristallisee, la source et le drain desdits seconds transistors comprenant une partie de ladite premiere couche conductrice.

Zvi Or-Bach

Papers

Methods for producing a 3D semiconductor memory device and structure

Method for producing a 3d memory device

3D IC semiconductor device and structure with stacked memory

3D semiconductor device with isolation layers

Dispositif à semi-conducteurs, et structure associée