Proceedings ArticleDOI
A self-correcting active pixel camera
Israel Koren,Glenn H. Chapman,Zahava Koren +2 more
- pp 56-64
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TLDR
The purpose of this paper is to investigate the advantages of incorporating some fault-tolerance methods, including redundancy, into the design of an active pixel sensor array.Abstract:
Digital cameras on-a-chip are becoming more common and are expected to be used in many industrial and consumer products. With the size of the CMOS active pixel-array implemented in such chips increasing to 512/spl times/512 and beyond, the possibility of degradation in the reliability of the chip over time must be a factor in the chip design. In digital circuits, a commonly used technique for reliability or yield enhancement is the incorporation of redundancy (e.g., adding redundant rows and columns in large memory ICs). Very limited attempts have been directed towards fault-tolerance in analog circuits, mainly due to the very high level of irregularity in their design. Since active pixel arrays have a regular structure, they are amenable to reliability enhancement through a limited amount of added redundancy. The purpose of this paper is to investigate the advantages of incorporating some fault-tolerance methods, including redundancy, into the design of an active pixel sensor array.read more
Citations
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Journal ArticleDOI
Review of CMOS image sensors
TL;DR: In this paper, CMOS Image Sensors are reviewed, providing information on the latest advances achieved, their applications, the new challenges and their limitations, leading to the State-of-the-art of CMOS image sensors.
Journal ArticleDOI
Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems
TL;DR: Parametric simulation results demonstrate the speed and virtual yield enhancement by using the proposed approach; thereby highly reliable, yet inexpensive, soft-test/repair of CCD-based digital X-ray systems can be ultimately realized.
Proceedings ArticleDOI
Design of a self-correcting active pixel sensor
Yves Audet,Glenn H. Chapman +1 more
TL;DR: Simulations show an active pixel sensor self-correcting for most common faults is created by splitting the photodiode and readout transistors into two parallel portions with only a small area cost and operation is the same for a single large device with no faults.
Journal ArticleDOI
A self-correcting active pixel sensor using hardware and software correction
TL;DR: A highly reliable system based on a fault-tolerant architecture that effectively combines hardware redundancy in the APS cells and software correction techniques for the production of high-quality images in harsh environments is presented.
Proceedings ArticleDOI
Robust detection of defects in imaging arrays
TL;DR: This paper presents an algorithm that utilizes statistical information extracted from a sequence of normally captured images to identify the location and type of defective pixels and Bayesian statistics to more accurately infer the likelihood of each defect, which successfully improves the detection time.
References
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Journal ArticleDOI
A single chip CMOS APS camera with direct frame difference output
Shyh-Yih Ma,Liang-Gee Chen +1 more
TL;DR: In this paper, a complementary metaloxide-semiconductor (CMOS) active pixel sensor (APS) camera chip with direct frame difference output is reported, where the pixel circuit occupies 32.2/spl times/32.2 /spl mu/m/sup 2/ with a fill factor of 33%.
Proceedings ArticleDOI
Creating 35 mm camera active pixel sensors
Glenn H. Chapman,Yves Audet +1 more
TL;DR: A 36/spl times/24 mm active pixel sensor imaging area device is studied which would be ideal for use with standard 35 mm cameras, and having larger photodiode pixels than current APS's this CMOS device would be nearly as sensitive as CCD's but at much lower production costs and much higher yields.
Proceedings ArticleDOI
A low-power digital camera-on-a-chip implemented in CMOS active pixel approach
TL;DR: This work reports the first fully digital, programmable, 5-wire, large format digital-camera-on-a-chip that integrates the imager array, control logic, ADC, and bias generation on the same chip.