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Journal ArticleDOI

An analysis of accelerated performance degradation tests assuming the arrhenius stress-relationship

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TLDR
An analytical model is developed for accelerated performance degradation tests and the method of maximum likelihood estimation is used to estimate the parameters involved, using two real examples for estimating the failure-time distribution.
Abstract
An analytical model is developed for accelerated performance degradation tests. The performance degradations of products at a specified exposure time are assumed to follow a normal distribution. It is assumed that the relationship between the location parameter of normal distribution and the exposure time is a linear function of the exposure time that the slope coefficient of the linear relationship has an Arrhenius dependence on temperature, and that the scale parameter of the normal distribution is constant and independent of temperature or exposure time. The method of maximum likelihood estimation is used to estimate the parameters involved. The likelihood function for the accelerated performance degradation data is derived. The approximated variance-covariance matrix is also derived for calculating approximated confidence intervals of maximum likelihood estimates. Finally we use two real examples for estimating the failure-time distribution, technically defined as the time when performance degrades below a specified level.

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Citations
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Journal ArticleDOI

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

TL;DR: In this article, the relation between the Arrhenius equation and the lognormal distribution in the degradation process was studied, and it was shown that the ratio of the differences between logarithmic standard deviations must be equivalent at different temperature levels.
Proceedings ArticleDOI

Rubber lifetime prediction for ADT data considering non-arrhenius behavior

TL;DR: In this paper, a non-Arrhenius ADT model was used to estimate the lifetime distribution of the rubber under normal conditions. And the degradation path model was extended to similar degradation path models as well as stochastic process models.
References
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Book

Statistical Methods for Reliability Data

Wayne Nelson
TL;DR: In this paper, the use of Bayesian methods for reliability data is discussed and a detailed discussion of the application of these methods in the context of automated life test planning is presented.
Book

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses

Wayne Nelson
TL;DR: Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, by W. Nelson.
Journal ArticleDOI

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses

William Q. Meeker
- 01 May 1991 - 
TL;DR: In this article, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses Technometrics: Vol 33, No 2, pp 236-238 and this article.
Journal ArticleDOI

Using Degradation Measures to Estimate a Time-to-Failure Distribution

TL;DR: In this article, the authors developed statistical methods for using degradation measures to estimate a time-to-failure distribution for a broad class of degradation models, using a nonlinear mixed-effects model and developing methods based on Monte Carlo simulation to obtain point estimates and confidence intervals for reliability assessment.
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