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Accelerated Testing: Statistical Models, Test Plans, and Data Analyses

Wayne Nelson
TLDR
Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, by W. Nelson.
Abstract
Preface.1. Introduction and Background.2. Models for Life Tests with Constant Stress.3. Graphical Data Analysis.4. Complete Data and Least Squares Analyses.5. Censored Data and Maximum Likelihood Methods.6. Test Plans.7. Competing Failure Modes and Size Effect.8. Least-Squares Comparisons for Complete Data.9. Maximum Likelihood Comparisons for Censored and Other Data.10. Models and Data Analyses for Step and Varying Stress.11. Accelerated Degradation.Appendix A. Statistical Tables.References.Index.

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Book

Statistical Methods for Reliability Data

Wayne Nelson
TL;DR: In this paper, the use of Bayesian methods for reliability data is discussed and a detailed discussion of the application of these methods in the context of automated life test planning is presented.
Journal ArticleDOI

Mass customization: Literature review and research directions

TL;DR: The literature on mass customization is surveyed and approaches to implementing mass customization are compiled and classified and future research directions are outlined.
Journal ArticleDOI

Driving to Safety: How Many Miles of Driving Would It Take to Demonstrate Autonomous Vehicle Reliability?

TL;DR: In this paper, the authors calculate the number of miles of driving that would be needed to provide clear statistical evidence of autonomous vehicle safety and show that fully autonomous vehicles would have to be driven hundreds of millions of miles and sometimes hundreds of billions of miles to demonstrate their reliability in terms of fatalities and injuries.
Journal ArticleDOI

Residual-life distributions from component degradation signals: A Bayesian approach

TL;DR: Bayesian updating methods that use real-time condition monitoring information to update the stochastic parameters of exponential degradation models are developed and used to develop a closed-form residual-life distribution for the monitored device.
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A Review of Accelerated Test Models

TL;DR: This paper provides a review of many of the AT models that have been use successfully in this area and makes important contributions in the development of appropriate stochastic models for AT data.
References
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Journal ArticleDOI

Accelerated Testing: Statistical Models, Test Plans, and Data Analyses

William Q. Meeker
- 01 May 1991 - 
TL;DR: In this article, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses Technometrics: Vol 33, No 2, pp 236-238 and this article.