Journal ArticleDOI
Analogue-digital window comparator with highly flexible programmability
Reads0
Chats0
TLDR
A mixed analogue-digital window comparator is presented whose boundaries can be programmed independently, with untrimmed matching accuracy as good as 0.1%.Abstract:
A mixed analogue-digital window comparator is presented whose boundaries can be programmed independently, with untrimmed matching accuracy as good as 0.1%. Only one voltage reference is needed and its accuracy does not affect the precision with which the width of the comparison window is defined.read more
Citations
More filters
Journal ArticleDOI
An adaptive checker for the fully differential analog code
TL;DR: The design of an adaptive checker for concurrent error detection in fully differential analog circuits and the chip test results prove the feasibility of the adaptive thresholding concept.
Proceedings ArticleDOI
Self-testable full range window comparator
Yubin Zhang,M.W.T. Wong +1 more
TL;DR: By making the comparator self-testable hence the potential problem of a faulty comparator circuit during test mode operation is greatly reduced, the design effort already spent in providing an effective means of testing SOCs is leveraged.
Proceedings ArticleDOI
Built-in-self-testing techniques for programmable capacitor arrays
A. Laknaur,Haibo Wang +1 more
TL;DR: The accuracy of the proposed circuit techniques is investigated and closed-form equations are derived for estimating comparison accuracy that can be achieved by the proposed techniques.
Proceedings ArticleDOI
A Programmable Window Comparator for Analog Online Testing
A. Laknaur,Rui Xiao,Haibo Wang +2 more
TL;DR: Experimental results demonstrate that improved fault detection capability is achieved by using the proposed design of a programmable window comparator with adaptive error threshold.
Journal ArticleDOI
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays
TL;DR: Effective circuit techniques along with new comparator designs are presented to minimize the adverse effect of comparator threshold variations and procedures for using the proposed BIST method to systematically test all PCAs on an FPAA platform are described and experimental results are presented.
References
More filters
Book
Analog MOS Integrated Circuits for Signal Processing
Roubik Gregorian,Gabor C. Temes +1 more
TL;DR: In this article, the authors present an overview of the non-ideal effects in Switched-Capacitor Circuits, as well as their application in switch-capacitor circuits.