Journal ArticleDOI
Automated ADC characterisation using the histogram test stimulated by Gaussian noise
R. Cameiro Martins,A. Cruz Serra +1 more
- Vol. 48, Iss: 2, pp 471-474
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TLDR
A broadband variant of the histogram test where Gaussian noise is used as a stimulus signal is presented and tolerance and confidence intervals are determined both for the integral nonlinearity (INL) and differential non linearity (DNL) vectors, related to the number of samples acquired.Abstract:
A broadband variant of the histogram test where Gaussian noise is used as a stimulus signal is presented. A methodology allowing for an automated and extensive characterization of analog-to-digital converters (ADCs) is given. Tolerance and confidence intervals are determined both for the integral nonlinearity (INL) and differential nonlinearity (DNL) vectors, related to the number of samples acquired. Experimental results of the characterization of a VXI waveform digitizer using this methodology are shown.read more
Citations
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Journal ArticleDOI
Statistical efficiency of the ADC sinewave histogram test
TL;DR: An analysis of the statistical efficiency of the sinewave histogram test used for estimating the unknown transition levels of an analog-to-digital converter and a closed-form determination of the Cramer-Rao bound are presented.
Journal ArticleDOI
Linearity Testing of A/D Converters Using Selective Code Measurement
Shalabh Goyal,Abhijit Chatterjee +1 more
TL;DR: A novel test generation methodology is presented for measuring the relevant code widths using a piecewise linear ramp that is designed to extract test information accurately from test data in minimal test time.
Journal ArticleDOI
ADC characterization by using the histogram test stimulated by Gaussian noise: Theory and experimental results
R.C. Martins,A.C. Serra +1 more
TL;DR: Experimental and simulation results concerning the characterization of a 12-bit PC acquisition board and an expression of tolerance interval as a function of the number of samples acquired given a certain confidence level are presented.
Journal ArticleDOI
A new bidimensional histogram for the dynamic characterization of ADCs
TL;DR: A bidimensional histogram based on a dual-tone signal is proposed for testing analog-to-digital converters in the phase plane and the effectiveness and the practical applicability in standardization of the proposed method are highlighted.
Journal ArticleDOI
Analog-to-digital converter testing—new proposals
TL;DR: A new test method based on the Histogram Method but using small-amplitude triangular waves with a variable offset is shown to have several advantages over the traditional static test, namely a dramatic reduction in test duration even for high-resolution ADCs.
References
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Journal ArticleDOI
Full-speed testing of A/D converters
TL;DR: Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described.
Journal ArticleDOI
Histogram measurement of ADC nonlinearities using sine waves
TL;DR: This paper gives results concerning the measurement of differential and integral nonlinearity of ADC's using the histogram method with a sine wave input signal and the effect on the results of harmonic distortion of the applied signal.
Journal ArticleDOI
A critical note on histogram testing of data acquisition channels
TL;DR: This method is shown that this method is very insensitive to the out-of-phase components of the digitizers' response to a sine wave excitation, which can lead to an underestimate of the nonlinear behavior of theDigitizer.
Proceedings ArticleDOI
The use of a noise stimulus in ADC characterization
TL;DR: The stationary transfer function of an A/D converter (ADC) is determined through the use of a noise stimulus and the histogram test and a justification for the choice of a normal distributed noise is given.