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Journal ArticleDOI

Development of a cost-effective high-performance metal QFP packaging system

TLDR
The MQUAD as discussed by the authors is a high performance reliable technology currently in use for packaging of microprocessors, high speed ASIC devices, including CMOS, Bi CMOS and Bi polar, gallium arsenide, and other high performance IC's.
Abstract
This paper describes the design and development of MQUAD technology. The MQUAD packaging system is a high performance reliable technology currently in use for packaging of microprocessors, high-speed ASIC devices, including CMOS, Bi CMOS, Bi polar, gallium arsenide, and other high performance IC's. The packaging technology is being used for devices dissipating up to 14 watts and switching speed of up to 300 MHz. The design and development was carried out with the objectives of high thermal performance (up to 15 watts), high electrical performance (inductance and capacitances lower than comparable PQFPs) and reliability superior to the PQFPs. The approach taken was; to use an adhesively bonded metal package. An aluminum alloy lid and base were chosen to give excellent heat dissipation ability, mechanical integrity and light weight construction. A special anodization process was developed to put a hard, electrically insulating black colored anodic film on the aluminum alloy components. The adhesive seal is a filled epoxy having low dielectric constant and low ionic content and with excellent adhesion to both copper alloys and aluminum anodic films, especially in moist environments. The leadframe chosen is a high-strength, thermally conductive copper alloy. The assembly process for the MQUAD package emulates the PQFP assembly process except that the molding step is replaced by a single step pad attach simultaneous with the seal adhesive lamination/cure process. The leadframe pad is attached to the anodized aluminum alloy base via a silver-filled epoxy paste. The package was thoroughly tested for reliability and fully characterized for thermal and electrical performance. Reliability tests performed include temperature cycling, thermal shocks, solvent resistance, flammability, pressure cooker, and vapor phase shocks. Reliability of MQUAD packages is superior to that of PQFPs. Characterization includes /spl theta//sub ja/ and /spl theta//sub jc/, and resistance, inductance and capacitance measurements. Thermal and electrical performance of MQUAD packages equal or exceed that of comparable plastic or ceramic QFPs. The high reliability and performance of MQUAD was confirmed by many customers and users and has been published. Because of these benefits, the technology is being further extended to advanced packages such as MCMs, TAB and ball or pad grid arrays. >

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Citations
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Patent

Method of replenishing electroless gold plating baths

TL;DR: In this article, a method of replenishing a cyanide-based electroless gold plating bath with the solution of the present invention is presented. But this method requires the use of an alkali to maintain the pH of the solution between 8 and 14.
Patent

Apparatus and method for electroplating pin grid array packaging modules

TL;DR: In this article, an apparatus and a method for electroplating pin grid array (PGA) packaging modules by utilizing a compressible member and an electrically conductive foil for providing electrical connections to the pins such that all the critical areas of the pins, the wire bond pads, the seal band and the die cavity are electroplated simultaneously through the connection to the pin.
Proceedings ArticleDOI

A non-dimensional correlation for the external thermal characteristics of surface mount metal quad flat packs

TL;DR: In this article, a non-dimensional correlation has been developed for the external thermal characteristics (case-to-air thermal resistance) of a surface mount metal quad flat pack in the mixed convection regime.
Journal ArticleDOI

Study of anodized Al substrate for electronic packaging

TL;DR: In this article, an anodic film around 20-30 µm thickness was used to separate the circuitry from the metal plate, and the dielectric constant was about 7 and breakdown voltage exceeded 1000 V. Electroless copper plating was attempted to complete the metallization of the anodized Al substrate.
Proceedings ArticleDOI

Transient thermal model for the MQUAD microelectronic package

TL;DR: In this article, a numerical, lumped-parameter transient thermal model has been developed which accurately predicts the temperature of the die and other components of an MQUAD package in situations in which the power to the die changes.
References
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Book

Protective coatings for metals

TL;DR: In this article, the authors present a comprehensive presentation on the control of corrosion through the use of protective coatings, including information on the production of coating materials and applications of coatings.
Patent

Protective coatings for metals

TL;DR: In this article, a metal product comprising a metal surface, an oxide layer and a glass layer is provided by coating a stable aqueous silicate or borosilicate solution onto the metal surface.
Proceedings ArticleDOI

Thermal analysis of plastic QFP with high thermal dissipation

M. Tanaka, +1 more
TL;DR: In this article, the influence of a difference in materials or dimensions of a lead frame with a heat spreader on the thermal resistance was analyzed, and the results showed that the effect of different materials and dimensions of the lead frame had an excellent effect on thermal resistance, approximately 10 degrees C/W or larger reduction.
Journal ArticleDOI

Thermal characterization of plastic and ceramic surface-mount components

TL;DR: In this paper, the thermal performance of devices packaged with the 68-, 84-, 100-, and 124-lead members of the plastic and ceramic flatpack family of surface-mounted components (PFP and CPF, respectively) is characterized.
Proceedings ArticleDOI

Comparison of thermal enhancements to a commercial quad flatpack

Chris Wyland
TL;DR: In this paper, the thermal characteristics of three 160 pin commercial quad flatpack were examined, and a possible heuristic for modeling semiconductor component packaging was introduced, which was shown to be generally accurate within 5% of the measured values using the data presented.
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