Journal ArticleDOI
Dynamic Idd test circuit for mixed signal ICs
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TLDR
In this article, a built-in test circuitry is proposed that uses the dynamic supply current consumption of a mixed signal circuit under test for a unified fault detection method, and a simulation waveform is used to illustrate the performance of the proposed circuitry.Abstract:
Built-in test circuitry is proposed that uses the dynamic supply current consumption of a mixed signal circuit under test for a unified fault detection method. Simulation waveform are reported to illustrate the performance of the proposed circuitry.read more
Citations
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Proceedings ArticleDOI
On-chip transient current monitor for testing of low-voltage CMOS IC
TL;DR: The proposed monitor does not affect the performance of the CUT and can be efficiently used to test low-voltage CMOS circuits and provides detection capabilities for open defects that usually cause a significant reduction of the I/sub DDT/ current.
Journal ArticleDOI
Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
TL;DR: This paper presents a new approach for detecting defects in analog integrated circuits using the feed-forward neural network trained by the resilient error back-propagation method and optimized hardware architecture of the selected neural network type was designed using VHDL for FPGA realization.
Supply current test of analogue and mixed signal circuits : Mixed signal & analogue IC test technology
TL;DR: In this paper, a short review of the literature on this subject is given, and the requirements for fault modelling and simulation to support supply current test are discussed and some initial results of accelerating this process using macromodelling are presented.
Journal ArticleDOI
Supply current test of analogue and mixed signal circuits
TL;DR: In this paper, a short review of the literature on this subject is given, and the requirements for fault modelling and simulation to support supply current test are discussed and some initial results of accelerating this process using macromodelling are presented.
Proceedings ArticleDOI
Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics
TL;DR: A Built-In Current Sensor (BICS) is presented which is able to process the highest frequency components in the dynamic power supply current of the circuit under test (CUT) and improves the fault coverage in continuous circuits and switched current circuits as well.