Patent
High speed function tester for integrated circuits
Yasuo Tarui,Yutaka Hayashi +1 more
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TLDR
In this paper, the authors present a test apparatus composed of a clock signal generating circuit, a patterned pulse generating circuit operated in synchronism with the clock signal generator, and a circuit for detecting the coincidence between the output from the comparator circuit and the output of the function pulse generator.Abstract:
The test apparatus is composed of a clock signal generating circuit, a patterned pulse generating circuit operated in synchronism with the clock signal generating circuit, with the output of the patterned pulse generating circuit being furnished to an integrated circuit to be tested, a reference voltage generating circuit, a comparator circuit to compare the output pulses from the integrated circuit to be tested with the output from the reference voltage generating circuit, a function pulse generating circuit synchronized with an output from the comparator circuit, a circuit for detecting coincidence between the output from the comparator circuit and the output from the function pulse generating circuit, and a displaying circuit to display the output of the coincidence detecting circuit, whereby the validity of the integrated circuit is determined from the coincidence of the output pulses from the integrated circuit with the expected pulse patterns obtained from the function pulse generating circuitread more
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