Proceedings ArticleDOI
Improved Built-In Self-Test of Sequential Circuits
Hosna Jabbari,Jon C. Muzio,Lin Sun +2 more
- pp 78-81
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TLDR
A new class of one-dimensional cellular automata is presented that shows better pseudo-randomness properties based on Knuth's empirical tests than linear hybrid cellular Automata and linear feedback shift register.Abstract:
In this paper, we present a new class of one-dimensional cellular automata (which can be considered as a special case of a two dimensional cellular automata) that shows better pseudo-randomness properties based on Knuth's empirical tests than linear hybrid cellular automata and linear feedback shift register. A theorem is given to calculate the number of distinct transitions and the effectiveness of our proposed cellular automata is investigated by using them as test pattern generators for built-in self-test of the ISCAS 89 benchmark circuits. Our experimental results show that our cellular automata produce better sequential fault coverage than linear feedback shift register and linear hybrid cellular automata.read more
References
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Journal ArticleDOI
Cellular automata-based pseudorandom number generators for built-in self-test
TL;DR: The cellular automata-logic-block-observation circuits presented are expected to improve upon conventional design for testability circuitry such as built-in logic-block operation as a direct consequence of reduced cross correlation between the bit streams that are used as inputs to the logic unit under test.
Book
Testing of Digital Systems
Niraj K. Jha,Sandeep K. S. Gupta +1 more
TL;DR: This book is the most comprehensive introduction available to the range of techniques and tools used in digital testing, including fault simulation, CMOS testing, design for testability, and built-in self test.