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Patent

Method of and apparatus for controlling reactive impedances of a matching network connected between an rf source and an rf plasma processor

TLDR
In this article, a reactive impedance element to a plasma in a vacuum plasma processing chamber is connected via a matching network including first and second variable reactances that control loading of the source and tuning a load, including the reactive impedance elements and the plasma, to the source.
Abstract
An r.f. field is supplied by a reactive impedance element to a plasma in a vacuum plasma processing chamber. The element and source are connected via a matching network including first and second variable reactances that control loading of the source and tuning a load, including the reactive impedance element and the plasma, to the source. The values of the first and second variable reactances are changed to determine the amount the first variable reactance is to change for each unit change of the second variable reactance to attain the best match between the impedances seen looking into and out of output terminals of the r.f. source. Then the values of the first and second variable reactances are varied simultaneously based on the determination until the best impedance match between the impedances seen looking into and out of output terminals of the r.f. source is attained.

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References
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Patent

Automatic impedance matching apparatus and method

TL;DR: In this paper, an automatic impedance matching apparatus for matching an RF-signal generator to a load, such as a plasma etching chamber, is described, which consists of a matching network having two variable impedance devices, a tune detector for detecting the condition of the impedance match between the RF-Signal and the load, and a controller for modifying the values of the variable impedance components in response to the measured tune condition.
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Electronically tuned matching network using predictor-corrector control system

TL;DR: In this article, an impedance matching network and a network model are used to estimate the load impedance from known present network values and a measurement of network input impedance, and to estimate optimum network values from the input impedance and the estimated load impedance.
Patent

Plasma emission source

TL;DR: An impedance matching network for continuously and automatically maximizing RF power transfer to a plasma emission torch includes a dual phase detector network and a variable impedance network as discussed by the authors, which is used to control the detector network.
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Automatic impedance matching between source and load

TL;DR: An R.F. generator is used to provide power to a load via a transmission line wherein load impedance is automatically matched to the surge impedance of the transmission to provide maximum transfer of energy from the generator to the load.
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