New results in fault latency modelling

TLDR: The summary presented stresses that a self-test program should be designed to capitalize on the hardware mechanization of the processor, if this is not done, subtests tend to repeatedly exercise the same hardware components while neglecting to exercise a substantial proportion of the remainder.

Abstract: Studies carried out by McGough and Swern (1981, 1983) are summarized. In these studies, an avionics processor was simulated and a series of fault injection experiments was carried out to determine the degree of fault latency in a redundant flight control system that employed comparison monitoring as the exclusive means of failure detection. A determination was also made of the fault coverage of a typical self-test program. The summary presented stresses that a self-test program should be designed to capitalize on the hardware mechanization of the processor. If this is not done, subtests tend to repeatedly exercise the same hardware components while neglecting to exercise a substantial proportion of the remainder. It is also pointed out that fault latency is relatively independent of both the length and instruction mix of a program. A significant difference is found in fault coverage assessed using pin-level and gate-level fault models.