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Journal ArticleDOI

Reducing the Proximity Effect in Electron Lithography

M.R. Soqard
- Vol. 38, pp 310-311
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The article was published on 1980-08-01. It has received 0 citations till now. The article focuses on the topics: Proximity effect (electron beam lithography).

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References
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Journal ArticleDOI

Energy dissipation in a thin polymer film by electron beam scattering

TL;DR: In this article, Monte Carlo calculations have been performed to determine the spatial distribution of energy dissipated in a 4000-A-thick film of polymethyl methacrylate (PMMA), due to an incident electron beam.
Journal ArticleDOI

Direct observation of backscatter electron distributions on surfaces

TL;DR: In this article, the use of vinyl ferrocene monomer as a contaminating agent for the direct SEM observation of backscatter electron flux from target surfaces is described, and the method readily yields a back scatter spatial current distribution as a function of radial distance r from the incident probe beam of the form JB(r) = exp(br).