Journal ArticleDOI
Relative flatness measurement of uncoated optical flats
C. F. Bruce,F P Sharples +1 more
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TLDR
A method is described for measuring the relative flatness of uncoated precision optical flats to lambda/1000 using scanning interferometry and can be made automatic fairly readily.Abstract:
A method is described for measuring the relative flatness of uncoated precision optical flats to lambda/1000. The method uses scanning interferometry and can be made automatic fairly readily.read more
Citations
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Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometer.
TL;DR: A FECO scanning interferometer is described, which has been used to determine statistics of polished surfaces having roughnesses under 100 A rms and was found to have smaller rms slopes than other surfaces of comparable roughness and scattered less than predicted by simple scalar scattering theory.
Journal ArticleDOI
Instrument function of the Fabry-Perot spectrometer
TL;DR: An outline and review of the theory of the parallel-plate Fabry-Perot spectrometer is presented, including the effects of etalon surface irregularities and the finite solid angle of radiation admitted through the etalon.
Patent
Light interference device with low degree of spacial coherence
Yoshiaki Kimura,Hiroshi Ito +1 more
TL;DR: In this article, a light interference device comprising a light source having a low degree of spacial coherence, an optical element having a reference surface for interference, and an optical system for providing a parallel light bundle, is described.
Patent
Surface flaw detection method
TL;DR: In this paper, a coherent light is applied to the surface of the examination object and also to a reference mirror surface to interfere with each other to form an interference image from which the flaw is detected.
Journal ArticleDOI
A compensated optical profilometer for wavefront control of Virgo gravitational wave antenna optics
TL;DR: In this paper, a profilometer sensitive to the sample local slope was developed, which measures mirror profiles with nanometre sensitivity over a large frequency range, without any need for a reference surface.
References
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Journal ArticleDOI
Stresses developed in optical film coatings.
TL;DR: The development of stress in evaporated dielectric and metal films, used as optical coatings, has been investigated experimentally by observing the bending of a thin silica strip as it becomes coated.
Journal ArticleDOI
Precise Measurement of Planeness
G Schulz,J Schwider +1 more
TL;DR: A relative method, where, with the aid of fringes of superposition, the fringe separation is subdivided equidistantly thus achieving an increase of measuring precision, and an absolute method which determines the deviations of a surface from ideal planeness along arbitrary central sections, without a liquid surface.
Journal ArticleDOI
Establishing an Optical Flatness Standard
TL;DR: Methods proposed by the authors to establish a flatness standard without using a liquid mirror are proved in practice and extended and Linear errors of sums of deviations which can lead to ambiguities and errors of planeness deviations can be discovered and completely eliminated.
Journal ArticleDOI
Wavelengths of Krypton 86, Mercury 198, and Cadmium 114
TL;DR: In this article, the vacuum wavelengths and spectral line profiles of four lines of krypton 86, four line of mercury 198, and four line lines of cadmium 114 have been measured.
Journal ArticleDOI
The Determination of the Absolute Contours of Optical Flats
TL;DR: Emerson's procedure (the one in use at the National Bureau of Standards) for determining the absolute contours of optical flats was refined to increase the precision of the method and the speed of taking readings.