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Journal ArticleDOI

Spherical-wave corrections in photoelectron diffraction.

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This article is published in Physical Review B.The article was published on 1989-03-15. It has received 51 citations till now. The article focuses on the topics: X-ray absorption fine structure & Diffraction.

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Journal ArticleDOI

X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallography

TL;DR: In this paper, a critical review is given of a new technique, developed during the past several years, for surface crystallography, based on the observation that X-ray photoelectrons and Auger electrons with kinetic energies of a few hundred electron volts and above exhibit enhanced intensities along internuclear axes, or bond directions, connecting the emitting atom with its nearest and next-nearest neighbor atoms.
Journal ArticleDOI

Epitaxial film crystallography by high-energy Auger and X-ray photoelectron diffraction

TL;DR: In this paper, the authors review the application of Auger and X-ray photoelectron diffraction at high electron kinetic energies to the problem of structure determination in ultrathin epitaxial overlayers.
Book ChapterDOI

The Study of Surface Structures by Photoelectron Diffraction and Auger Electron Diffraction

TL;DR: A knowledge of the atomic identities, positions, and bonding mechanisms within the first 3-5 layers of a surface is essential to any quantitative microscopic understanding of surface phenomena as mentioned in this paper, which implies knowing bond directions, bond distances, site symmetries, coordination numbers, and the degree of both short-range and long-range order present in this selvedge region.
Journal ArticleDOI

Structural effects in single-crystal photoelectron, Auger-electron, and Kikuchi-electron angular diffraction patterns

TL;DR: In this paper, the full-hemisphere diffraction patterns of primary photoelectrons, photoemission Auger electrons, and Kikuchi electrons are reported for single-crystal surfaces of Cu(100), Cu(111, Cu(110), Cu (110), Ir(111), and Ag(100) to test models for direct structure determinations from angle-dependent final-state diffraction pattern.
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