Journal ArticleDOI
Stem and CTEM observations of interference between Laue- and Bragg-diffracted electrons in images of polyhedral crystals
P.S. Turner,John M. Cowley +1 more
TLDR
In this paper, interference effects have been observed at the edges of images of cubic MgO crystals oriented so that one {100} face is almost parallel to the electron beam.About:
This article is published in Ultramicroscopy.The article was published on 1981-01-01. It has received 17 citations till now. The article focuses on the topics: Total internal reflection & Diffraction.read more
Citations
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Journal ArticleDOI
Surface energies and surface structure of small crystals studied by use of a stem instrument
TL;DR: In this article, the surfaces of small regularly-shaped crystals of MgO and NiO have been examined by use of a scanning transmission electron microscopy (STEM) instrument, and images of the surfaces obtained with diffracted electron beams show surface detail with high resolution.
Journal ArticleDOI
Atomic and other structures of cleaved GaAs(110) surfaces
TL;DR: In this paper, the same authors applied reflection electron microscopy (REM) to study the cleavage planes of GaAs crystals, and the results showed that surface steps on an atomic scale and dislocations were imaged, as well as crystal fibers and other features.
Journal ArticleDOI
New imaging methods for catalyst particles
TL;DR: In this paper, the application of various bright field and dark field imaging methods to the study of catalyst and other small particles in the presence of scattering effects from the support is described, and a major advance has been possible with the use of annular dark field, Z contrast and microdiffraction techniques in the STEM.
Journal ArticleDOI
Surface imaging of III–V semiconductors by reflection electron microscopy and inner potential measurements
N. Yamamoto,John C. H. Spence +1 more
TL;DR: In this article, the surface steps were found to give characteristics contrast due to several diffraction effects, one of which is interference between the Bragg (B) and Bragg-Laue (BL) reflected beam at a step edge.
Journal ArticleDOI
Interactions of electron beams with surfaces of MgO crystals
T. Tanji,John M. Cowley +1 more
TL;DR: The strong interaction of electrons with the flat surfaces of small crystals has been investigated by high-resolution CTEM and STEM instruments as mentioned in this paper, where two kinds of external fringes are observed at (100) surfaces.
References
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Journal ArticleDOI
Some New Techniques in Reflection High Energy Electron Diffraction (RHEED)Application to Surface Structure Studies
TL;DR: In this paper, a new apparatus for reflection high energy electron diffraction (RHEED) provided with an electron gun with a sharply focused electron beam and operated under ultrahigh vacuum condition has been constructed.
Journal ArticleDOI
Image contrast of dislocations and atomic steps on (111) silicon surface in reflection electron microscopy
TL;DR: In this article, an analysis of dislocations emergent at the (111) surfaces of silicon crystals and on atomic surface steps by means of reflection electron microscopy (REM) is described and analyzed in detail in terms of Bragg contrast in in-focus images and Fresnel contrast in out of focus images.
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Surface structure and surface states in magnesium oxide powders
TL;DR: In this paper, the photoluminescent and reflectance spectra of MgO smoke have been compared with the spectra for ex-hydroxide and ex-carbonate, and a strong correlation exists between the optical spectra and the different morphology of the particles obtained by the different routes.
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The Magnetic Electron Microscope Objective: Contour Phenomena and the Attainment of High Resolving Power
James Hillier,E. G. Ramberg +1 more
TL;DR: In this article, a theoretical and experimental investigation of contour phenomena observed in electron microscope images near focus has been carried out and an explanation for the apparent reversal of the Fresnel fringes at exact focus is given.
Journal ArticleDOI
Innovative imaging and microdiffraction in stem
John M. Cowley,J. C. H. Spence +1 more