Proceedings ArticleDOI
Study of Short Term Stability of Crystal Oscillator
B. Boychuk,M. Bloch,G. Weiss,A. Thumim +3 more
- pp 264-272
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TLDR
In this article, the effects of noise on the r.m.s. frequency deviation of an oscillator were investigated and evidence was adduced to indicate that both effects occur in practical oscillators and some estimates of the magnitude of these effects are made.Abstract:
: A study is described of the effects of noise on the r.m.s. frequency deviation of an oscillator. Several models are assumed. In one case the noise and signal are linearly added and the assumption is made that the noise does not enter the feedback loop o the oscillator. It is shown that this predicts an inverse first power variation of the r.m.s. frequency deviation with respect to the integration time inherent in the frequency measurement. In other models, the noise is included in the feedback loop and results in an inverse one-half power variation. Evidence is adduced to indicate that both effects take place in practical oscillators and some estimates of the magnitude of these effects are made. (Author)read more
Citations
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Book ChapterDOI
Frequency and Time Measurements
TL;DR: In this article, the authors defined frequency as the number of cycles which occur in a given interval of time and time interval is usually chosen to be the second interval of the second.
References
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Journal ArticleDOI
Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics
TL;DR: In this article, the authors show that the current due to generation and recombination of carriers from generation-recombination centers in the space charge region of a p-n junction accounts for the observed characteristics.
Journal ArticleDOI
Physical Sources of Noise
TL;DR: In this article, it was shown that when the noise in electron flow is greater or less than pure shot noise, the motions of the electrons must be in some degree correlated and that the random interception of a fraction of the electron flow can reduce the correlation and increase the noise.
Journal ArticleDOI
Flicker noise in transistors
J.L. Plumb,E.R. Chenette +1 more
TL;DR: In this article, it is shown that for many modern transistors the noise sources are adequately represented by a single noise current generator connected in parallel with the emitter-base junction.
Journal ArticleDOI
Shot Noise in Transistors
G. H. Hanson,A. van der Ziel +1 more
TL;DR: In this article, the authors show that the shot noise generated in a transistor may be represented in an equivalent circuit by a current generator ip across the collector junction and an emf es in series with the emitter junction.