Open Access
Submillimeter Wavelength Modeling of Dielectric Materials in Polarimetric Radar Approaches
Robert H. Giles,A. P. Ferdinand,Michael J. Coulombe,Jerry Waldman,William E. Nixon,W. Reinhold +5 more
TLDR
In this article, a linearly polarized (LP) transmit/receive measurement system is used to characterize a variety of dielectric materials and demonstrate the feasibility of modeling clutter at microwave and millimeter wavelengths.Abstract:
: Development of two measurement techniques has made polarimetric study of dielectric materials at submillimeter wavelengths possible. The first technique, a linearly polarized(LP) transmit/receive measurement system probes polarimetric behavior of a dielectric material through observation of the material's Brewster angle. The second technique, utilizes the recently developed submillimeter quarter wave plate(QWP) to perform ellipsometric determination of the dielectric material's complex refractive index. In this paper submillimeter wavelength measurement techniques are used to polarimetrically characterize a variety of dielectric materials and demonstrate the feasibility of modeling clutter at microwave and millimeter wavelengths.read more
Citations
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Tailoring Artificial Dielectric Materials at Terahertz Frequencies
TL;DR: The Submillimeter Technology Laboratory (STL) at the University of Massachusetts Lowell has developed a methodology of tailoring the complex refractive index for artificial dielectrics at terahertz frequencies as mentioned in this paper.
ReportDOI
Characterization of Material Properties at Terahertz Frequencies
TL;DR: In this paper, the authors explore four measurement techniques typically employed by the U.S. Army National Ground Intelligence Center (STL) to perform the characterization of materials: (1) laser-based submillimeter-wave ellipsometry, (2) high-precision reflectometry; (3) laserbased Brewster' s angle measurements; and, (4) FIR Fourier transform spectroscopy (FTS).
Proceedings ArticleDOI
Design and fabrication of narrow band radar absorbing materials at terahertz frequencies
TL;DR: In this paper, the complex refractive index of an artificial dielectric material has been developed at the University of Lowell Research Foundation (ULRF) for low reflection coatings, generally referred to as Dallenbach layers, have been designed for metal substrates using the Artificial Dielectric.
References
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Book
Ellipsometry and polarized light
TL;DR: In this article, the polarization of light waves and propagation of polarized light through polarizing optical systems are discussed. But the authors focus on the application of ellipsometry in the field of measurement in ellipsometer systems.
Journal ArticleDOI
Equations for Calculating the Dielectric Constant of Saline Water (Correspondence)
TL;DR: In this article, the dielectric constant of saline water was represented by an equation of the Debye form and the parameters for the parameters were given as functions of the water temperature and salinity.
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TL;DR: In this paper, the Earth and its effects on radar are discussed, including the effects of surface roughness on Forward-Scattered Fields on radar reflectivity and the effect of the Earth's surface on radar.
Journal ArticleDOI
Theory of Models of Electromagnetic Systems
TL;DR: In this article, the conditions to be satisfied in an absolute model for accurate simulation are derived, and the limitations imposed on practical models are discussed, where the measurements are on a quantitative or absolute basis in terms of the full scale system.