Journal ArticleDOI
The Statistical Analysis of Failure Data
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TLDR
The reliability of memory with single error correction with ECC, and reliability modeling techniques for self repairing computer systems, are described.Abstract:
[1] W. F. Mikhail, R. W. Bartoldus, R. A. Rutledge, \"The reliability of memory with single error correction\", IEEE Trans. Computers, vol C-31, 1982 Jun, pp 560-564. [2] R. A. Rutledge, \"Models for the reliability of memory With ECC\", Proc. Annual Reliability and Maintainability Symp., 1985, pp 57-62 [3] F. J. Aichelmann Jr., \"Fault tolerant design techniques for semiconductor memory applications\", IBM J. Research & Development, vol 28, 1984 Mar, pp 177-183. [4] J. Von Bank, \"Catastrophic failure modes limit redundancy effectiveness\", IEEE Trans. Reliability, vol R-32, 1983 Dec, pp 409-411. [5] W. 0. Bouricius, W. C. Carter, P. R. Schneider, \"Reliability modeling techniques for self repairing computer systems\", Proc. 24th National Conf. ACM, 1969, pp 295-309.read more
Citations
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Journal ArticleDOI
Estimation of failure probabilities in the presence of competing risks: new representations of old estimators
Ted Gooley,Ted Gooley,Wendy M. Leisenring,Wendy M. Leisenring,John Crowley,John Crowley,Barry E. Storer,Barry E. Storer +7 more
TL;DR: A representation of each estimate in a manner not ordinarily seen is presented, each representation utilizing the concept of censored observations being 'redistributed to the right' to allow a more intuitive understanding of each estimates.
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Adjuvant Whole-Brain Radiotherapy Versus Observation After Radiosurgery or Surgical Resection of One to Three Cerebral Metastases: Results of the EORTC 22952-26001 Study
Martin Kocher,Riccardo Soffietti,Ufuk Abacioglu,Salvador Villà,François Fauchon,Brigitta G. Baumert,L. Fariselli,Tzahala Tzuk-Shina,Rolf-Dieter Kortmann,Christian Carrie,Mohamed Ben Hassel,Mauri Kouri,Egils Valeinis,Dirk van den Berge,Sandra Collette,Laurence Collette,Rolf-Peter Mueller +16 more
TL;DR: After radiosurgery or surgery of a limited number of brain metastases, adjuvant WBRT reduces intracranial relapses and neurologic deaths but fails to improve the duration of functional independence and overall survival.
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Phase III Trial of Trimodality Therapy With Cisplatin, Fluorouracil, Radiotherapy, and Surgery Compared With Surgery Alone for Esophageal Cancer: CALGB 9781
Joel E. Tepper,Mark J. Krasna,Donna Niedzwiecki,Donna Hollis,Carolyn E. Reed,Richard M. Goldberg,K Kiel,Christopher G. Willett,David J. Sugarbaker,Robert J. Mayer +9 more
TL;DR: The results from this trial reflect a long-term survival advantage with the use of chemoradiotherapy followed by surgery in the treatment of esophageal cancer, and support trimodality therapy as a standard of care for patients with this disease.
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Survival analysis in telemetry studies: the staggered entry design
TL;DR: A simple modification of the Kaplan-Meier procedure is developed that allows for new animals to be added after the study has begun, and a discussion of model assumptions and directions for future research is presented.
Journal ArticleDOI
Outcomes 15 years after valve replacement with a mechanical versus a bioprosthetic valve: final report of the Veterans Affairs randomized trial.
Karl E. Hammermeister,Gulshan K. Sethi,William G. Henderson,Frederick L. Grover,Charles Oprian,Shahbudin H. Rahimtoola +5 more
TL;DR: At 15 years, patients undergoing AVR had a better survival with a mechanical valve than with a bioprosthetic valve, largely because primary valve failure was virtually absent with mechanical valve.
References
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Journal ArticleDOI
Fault-tolerant design techniques for semiconductor memory applications
TL;DR: A number of design approaches are presented for minimizing the efects of chip failures through the use of organizational techniques and through enhancements to conventional error checking and correction facilities that are compatible with most existing memory designs.
Journal ArticleDOI
The Reliability of Memory with Single-Error Correction
Mikhail,Bartoldus,Rutledge +2 more
TL;DR: This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction, with a wide range of memory organizations.