Fig. 3. Dependence of resistance for ON and OFF states on the area of the device. (Inset) Cumulative probability of writing voltage for different device areas [(noted as “1” in the inset) 30 × 30, (2) 50 × 50, (3) 100 × 100, (4) 200 × 200, (5) 400 × 400, and (6) 600 × 600 μm2].
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