Showing papers on "Electron tomography published in 1979"
TL;DR: In this paper, electron-channelling images are observed by scanning electron microscopy with backscattered electrons and have the same origin as the contrast observed in electron channelling patterns.
Abstract: Electron–channelling imaging is a new method for observing defects in solid crystalline samples. The images are observed by scanning electron microscopy with backscattered electrons and have the same origin as the contrast observed in electron–channelling patterns. The observations reported here concern dislocations in silicon. The explored depth benoath the surface is around 1000 A and the resolution around 100 A.
106 citations
34 citations
TL;DR: The most widely used method of investigating ferromagnetic films in the transmission electron microscope is the Fresnel or defocus mode of Lorentz microscopy as mentioned in this paper, which may be implemented either in a fixed beam or a scanning instrument.
26 citations
TL;DR: In this article, the defocus contrast technique is applied to semi-crystalline polymers, where the difference in density between amorphous and crystalline regions gives rise to the de-focus contrast.
Abstract: Image formation in polymer electron microscopy is discussed with particular reference to the defocus-contrast technique in which interfaces between regions with different electron densities can be imaged. This method is applied to semi-crystalline polymers, where the difference in density between amorphous and crystalline regions gives rise to the defocus contrast. While other techniques of imaging semicrystalline polymers (i.e., staining, ion etching, etc.) suffer from the fact that during the preparation uncontrolled changes in the structure of the polymer can occur, the defocusing technique permits the direct observation of the polymer structure. Furthermore, sequences of micrographs from the very same area can give information about molecular processes although the technique is limited by beam damage. Results are reported concerning lamellar crystallization, lamellar thickening during annealing, and the two-phase domain structure in segmented polyurethane, in addition to several general appli...
22 citations
TL;DR: By combining electron spectroscopy and electron microscopy, this microanalytical technique can be performed in conjunction with highresolution imaging of the sample and has advantages of sensitivity, spatial resolution, and convenience over other comparable techniques.
Abstract: The transmission electron energy-loss spectrum shows characteristic "edges" corresponding to the excitation of inner-shell electrons of atoms in a thin sample. Analysis of these edges provides detailed chemical, structural, and electronic data from the radiated volume. By combining electron spectroscopy and electron microscopy, this microanalytical technique can be performed in conjunction with highresolution imaging of the sample. It is shown that this approach has advantages of sensitivity, spatial resolution, and convenience over other comparable techniques.
18 citations
TL;DR: In this paper, the crystal structure of disodium nonatitanate (IV), NaETi9019, has been determined on the basis of 1 MV structure images, in which each of the Ti and Na atom sites is resolved.
Abstract: The crystal structure of disodium nonatitanate(IV), NaETi9019 , has been determined on the basis of 1 MV structure images, in which each of the Ti and Na atom sites is resolved. The crystal has monoclinic symmetry witha= 12.2, b=3.78, c= 15.3A, andfl=98°.The space group of the crystal is either C2/m or C2. The nonatitanate has a framework of a new type which is different from those of tri-, hexa- and heptatitanates. The structure consists of titanium dioxide bronze-type units interleaved with bridging TiO 6 octahedra.
18 citations
Patent•
04 Apr 1979
TL;DR: An electron microscope backscattered detector comprising an arm of scintillation material with a hole through which the electron beam passes, the hole being provided with a removable grounded liner to facilitate cleaning and prevent astigmatism problems due to electron build up as mentioned in this paper.
Abstract: An electron microscope backscattered detector comprising an arm of scintillation material with a hole through which the electron beam passes, the hole being provided with a removable grounded liner to facilitate cleaning and prevent astigmatism problems due to electron build up.
15 citations
TL;DR: In this paper, the effect of the biprism on the electron image is briefly analyzed using the geometric optical approximation, and different electron optical set-ups are discussed and illustrated by three examples relative to: thickness measurements of silver nuclei, an in-focus analysis of the magnetic domain wall, and an infocus detection of the microelectric field associated with reversebiased p-n junctions.
7 citations
4 citations
01 Jan 1979
TL;DR: In this paper, the physical basis of the techniques of X-ray microanalysis, summarizes some of the more important parameters influencing the microanalysis and presents its outstanding capabilities with a number of examples of metallurgical interest.
Abstract: Publisher Summary This chapter discusses analytical electron microscopy. The key to the analytical electron microscope is the controllable electron beam. By focusing the beam to a fine probe and collecting all the characteristic emitted radiations such as X rays, optical photons, inelastically scattered electrons, and energy loss electrons, the complete chemical composition and crystallography of the selected region could in principle be determined. The chapter discusses the physical basis of the techniques of X-ray microanalysis, summarizes some of the more important parameters influencing the microanalysis, and presents its outstanding capabilities with a number of examples of metallurgical interest. Performing X-ray microanalysis in the scanning transmission electron microscope (STEM) has two principal advantages over carrying it out in the electron probe microanalyzer. The first is an intrinsic advantage conferred by the use of very thin samples, thin enough for appreciable electron transmission. The second principal advantage of the STEM is that the microanalysis can be directly correlated to the substructural detail such as a local precipitate morphology or crystal structure obtained from the identical region in the conventional imaging or diffraction mode of the transmission microscope.
3 citations
TL;DR: In this article, the electric or magnetic field distribution in a discontinuous metal film is determined from a change of the image contrast observed in the transmission electron microscope, which can be used for measurement of electric fields larger than 10 6 V m -1 with a spatial resolution of a few angstroms.
14 Nov 1979
TL;DR: In this paper, an apparatus for vacuum evaporation of metals at pressures in the 10 Pa range is described, the essential part of which consists of a liquid nitrogen cooled furnace, which enables the removal of metal at a residual pressure of 2.10 Pa.
Abstract: An apparatus for vacuum evaporation of metals at pressures in the 10 Pa range is described, the essential part of which consists of a liquid nitrogen cooled furnace. This device enables evaporation of metals at a _o residual pressure of 2.10 Pa. References are given at the end of this section.
TL;DR: In this paper, a beam-multiplexing method was proposed to alter the distribution of the electron beam for microwriting using a single-crystal film, which can be incorporated into a scanning system to increase further the speed of writing or into projection systems to simplify the complex nature of thin-foil masks.
Abstract: Describes a beam-multiplexing method which alters the distribution of the electron beam for microwriting using a single-crystal film. Several patterns are addressed simultaneously using diffracted beams. The technique can be incorporated either into a scanning system to increase further the speed of writing or into projection systems to simplify the complex nature of thin-foil masks. A number of fundamental experiments have been performed using both transmission and scanning electron microscopes to demonstrate the versatility and limitations of the technique.
TL;DR: The modification aids the microscopist in his evaluation of tissue structural relationships by providing large areas of tissue for examination and reduces significantly the time required to prepare and examine standard 1-2 mm2 electron microscopy tissue sections.
Abstract: A modification of a scanning transmission electron microscope specimen holder which permits full viewing of large plastic embedded tissue sections is discussed. The method for producing one-centimeter diameter "giant" grids is explained and the procedure for sample preparation is outlined. The modification aids the microscopist in his evaluation of tissue structural relationships by providing large areas of tissue for examination and reduces significantly the time required to prepare and examine standard 1-2 mm2 electron microscopy tissue sections. Light and electron microscopic evaluations can be made on the same tissue sections.