Showing papers on "Test data published in 1987"

Japanese Activities on On‐Line Testing

Abstract: The on-line computer test control method (the on-line test) is a new experimental technique to directly simulate the earthquake response behavior of structural systems without using a shake table device. This paper presents a review of Japanese activities in the development and application of the on-line test. First, the history of the development of the on-line test and its software and hardware algorithms are described, and 27 previous on-line tests conducted by Japanese researchers are summarized. Second, the reliability of the on-line test is discussed. Sources that may bring errors in the response are defined, and efforts to examine their effects on the response and to control the response error growth are introduced. Third, two extensions of the on-line test concept are presented: the fast on-line test and the substructure on-line test.

Direct update of dynamic mathematical models from modal test data

Abstract: Two methods for the direct updating of mathematical models based on modal test data are described. A set of minimum required constraints derived from eigendynamic and force equilibrium conditions are presented. Both methods generate mass and stiffness matrices fitted exactly to the given modal test data. One method changes all coefficients of the mass respective to the stiffness matrix and lessens the solution effort by the algebraical elimination of the Lagrangian multipliers. The other method changes only those selected matrix coefficients requiring additional solutions for the numerical calculation of the Lagrangian multipliers. Examples and comments on the applicability of the methods are given.

How to Measure Performance and Use Tests

Abstract: Measuring Performance for Program Evaluation Preliminary Considerations Locating Existing Measures Determining How Well a Test Fits the Program Constructing a Test for Program Evaluation Validity and Reliability of Performance Instruments Using Performance Test Data

Manufacture of semiconductor device

Abstract: PURPOSE:To automatically select nondefective or defective chips by simple processes and to send them to the following process by a method wherein chips are tested by a tester to discriminate whether they are good or bad, the test result is recorded in the memory as map data, the wafer is cut chip by chip after the test and the nondefective chips are selected corresponding to the map data. CONSTITUTION:An address to correspond to the prescribed X-Y coordinates is given to each chip 7 arranged on a wafer 3 and information on nondefective chips 8 and defectives 9 is recorded in a memory (d) as map data on the basis of the test result to be performed by a tester (c). The test ended wafer 3 is cut by a cutting unit in every chip 7. The nondefective chips 8 alone are selected by a pickup mechanism (f) for chip and are installed on a die-bonding substrate 11. The test result is sent from a wafer prober (b) through a communication circuit 10 as map data according to requested data from a die-bonding unit (die-bonder) 5. The selection of the nondefectives is performed using the test data.

Statistical extrapolation of shrinkage data - part i: regression

Abstract: A large series of data on carefully controlled shrinkage test of concrete involving groups of large numbers of identical specimens is reported. The data are used to compare existing shrinkage formulas in ACI, CEB-FIP, and BP models. Assuming that only the measured data for a certain initial period are known, predictions are made for long- times and are compared with the sebsequently observed shrinkage strains. In this manner, various possible statistical regression models are examined and compared. Best predictions are obtained when the shrinkage formula is fitted to test data using nonlinear optimization, then linear regression in transformed variables is used to obtain the confidence limits for long-time predictions. It is concluded that good long-time predictions of shrinkage can be obtained on the basis of shrinkage test results on 80 mm diameter cylinders for a 3-week duration. These predictions involve only the intrinsic uncertainty of the material, on which the uncertainty due to ramdom environment, curing history, and differences in concrete composition must be superimposed for practical application.

Paper Complexity and the Interpretation of Conservation Research

Abstract: Paper variability and its influence on the methods of testing paper and the interpretation of test results is discussed. Variability of test data due to the composite and viscoelastic nature of paper, and moisture and temperature relationships is considered. Some topics covered are formation and furnish variability, the anisotropic nature of paper, network theories, preconditioning influences, and the hysteresis effect. Interpretation of test data is discussed with emphasis on the fold endurance test: its lack of precision, the wide variation in test results, and the possibilities for multiple interpretations

Effect of sink rate on ground effect of low-aspect-ratio wings

Abstract: An experimental investigation of dynamic ground effect has been conducted in the University of Kansas wind tunnel using delta wings of 60-, 70-, and 75-deg sweep, the XB-70 wing, and the F-104A wing. Both static and dynamic tests were made at a Reynolds number of 700,000. The investigation was restricted to conditions of constant sink rate (or flight path angle) and angle at attack. Test data have been compared to other test data, including dynamic flight test data of the XB-70 and F-104A. Limited flow visualization tests have been conducted. A significant dynamic effect was found for highly swept delta wings.

The CCRS SAR/MSS Anderson River Data Set

Abstract: Technical Committee no. 7 of the International Association of Pattern Recognition is seeking test data sets that would further research into pattern recognition for remote sensing. Such data sets are usually expensive to acquire and are rarely made available. The Canada Centre for Remote Sensing (CCRS) has chosen to make the SAR/MSS Data Set for Anderson River available. This paper describes the contents and structure of the data set. Several major studies were conducted using these data by the authors and their colleagues. This paper will also summarize the results of these investigations conducted over four years. Studies included classification accuracies with and without terrain slope and aspect corrections, optimum sensor and feature selection, texture features, and multisensor data integration. Finally, the authors describe the procedure whereby other scientists can gain access to the data set.

Testing circuit for random access memory device

Abstract: In a semiconductor random access memory device of the type having two or more data lines arranged in association with a single data input or output terminal is provided a memory testing circuit which is characterized in that test data is supplied to every one of the data lines and is written all at a time into a plurality of memory cells which may include those located adjacent each other, wherein the number of the memory cells into which test data is to be written simultaneously depends on the data lines to be selected so that different pieces of data can be respectively written into the individual memory cells. A portion of an address signal is used not for the selection of the memory cells during the test data write cycle of the testing operation but for controlling the inversion of the test data to be written into selected ones of the memory cells and is supplied to the memory cells associated with any one or more of the data lines, whereby pieces of data comple­mentary to each other can be supplied to the adjacent memory cells respectively through two of the data lines, providing a basis on which an interference test can be conducted for the memory cells located adjacent each other.

Some comments on the technical acceptability of Warrington's Recognition Memory Test.

Abstract: The technical merits of Warrington's Recognition Memory Test are reviewed. The test has a number of attractive features, but also a number of significant limitations including defects in the initial validation studies, ceiling effects for the verbal recognition memory test, and inadequate documentation of the effects of educational level so as to permit interpretation of individual test data. In addition, no reliability data, such as test-retest or inter-examiner reliability correlations, are reported. It is suggested, therefore, that in its present form the test has limitations as an instrument for use in routine neuropsychological assessment.

Digital line test equipment

Abstract: PURPOSE:To facilitate capacity test on a line with large capacity by providing a test equipment of a digital line comprising a full duplex transmission circuit transmitting/receiving a random data for line test to/from a time multiplex communication line, an instant comparison circuit of the data, an error measurement circuit, a microcomputer circuit and an intercomputer coupling circuit and conducting the automatic line test by a remote controller. CONSTITUTION:A line test start is commanded from the remote controller (a). The microcomputer circuit 1 issues a test start command to a data storage section 2 by the line test start command and the data storage section 2 outputs a test data to a time division multiplex communication line (e) via an output control section 4. In detecting a transmission time slot in such a case, a time slot detection section 6 supplies it to the output control section 4 and sends the test data to the time division multiplex communication line (e). The data is sent to a designated transmission line, reflected by a line terminator (b) and the reception side fetches the test data to an input control section 5 every time the time slot detection section 6 detects the received time slot. Then, the corresponding test data of the data storage section 2 is referenced and compared and the error number is counted and stored in a data comparison section 3. The microcomputer circuit 1 sends the result to the remote controller (a) via the intercomputer coupling circuit (f).

Quality Control Testing for a Sand-Bentonite Liner

Abstract: This paper presents the results of the quality control testing performed during the construction of a sand-bentonite liner for a sanitary landfill site in Central Florida. The available borrow soil was a fine sand with an average fines content of approximately 3. 5 percent. The specified permeability after the addition of a sodium bentonite was 10** minus **8 cm/sec or less. Preliminary test data indicated that this criterion could be achieved under laboratory mixing and compaction conditions with a minimum bentonite content of 5 percent. Prior to actual production, a total of thirteen test strips were constructed for the purpose of determining the optimal bentonite content, and the spreading, mixing and compaction procedures necessary to achieve the specified permeability under field conditions. The contractor elected to use hand labor for spreading, a pulvimixer for mixing, and a vibratory steel drum roller for compacting. Laboratory testing on samples retrieved from the test strips indicated that a minimum bentonite content of 6. 0 percent was required to achieve a permeability of 10** minus **8 cm/sec or less.

Semiconductor device tester

Abstract: A semiconductor device tester comprises a random data generator, an algorithmic data generator, and a serial data generator. The test data pattern of the data generators are selected and combined to produce test pattern data actually applied to a device under test. At least part of the test data pattern from the algorithmic data generator are applied to one of the random data generator and the serial data generator, which, responsive thereto, produces the random test pattern data or the serial test pattern data.

Stem — A Project on Software Test and Evaluation Methods

Abstract: STEM is an acronym for Software Test and Evaluation Methodologies. The objective of the STEM project was to evaluate a number of fault detection, fault prediction and failure estimation methods by applying them to the documented programs produced in PODS (Project on Diverse Software, IEEE Trans. S. Eng. Sept 1986) which contained known faults. At the time this paper was written, the STEM project was still in progress, but some of the results obtained have been surprizing. For the particular programs used in this project it was found that: Of the many types of test data examined, comparison testing with uniform random data seemed to be the most effective (even when compared with specially designed tests). Non-identical bugs in diverse programs generally conformed with the independent failure assumption and around 5% were negatively correlated.

Automatic fault location system for electronic devices

Abstract: An electronic board testing system includes a card testing device which is designed for use with a personal computer (PC) and arranged for connection to a unit under test. Through the utilization of a test-authoring program, a test-implementing program may be created by a test designer by inputting appropriate testing process flow information in response to inquiries displayed on the PC screens. The test implementing program thereby created is effective to subsequently present on the PC display, testing procedures and probe placements to an operator to enable the collection and comparison of test data in a step-by-step and point-by-point process and to display the test results associated therewith on the PC screen.

Method of generating test data

Abstract: The invention prepares test data on a logic LSI which includes a plurality of signal pins, a control pin for inputting an external control signal, and control circuitry responsive to the external control signal for setting the signal pins in a desired state according to a specified function thereof. In accordance with the invention, the method comprises the steps of storing first data in a first memory, the first data being representative of a specified function of individual pins; storing the second data in a second memory, the second data representing a plurality of pin states corresponding to a plurality of signal states set by the external control signal; reading first and second data from the first and second memory; selectively communicating the test control signal to the integrated circuit, generating third data representative of each pin state of individual pins of each signal state set by the external control signal; and storing the third data into a file as test data.

Application of physical parameter identification to finite-element models

Abstract: The time domain parameter identification method described previously is applied to TRW's Large Space Structure Truss Experiment Only control sensors and actuators are employed in the test procedure The fit of the linear structural model to the test data is improved by more than an order of magnitude using a physically reasonable parameter set The electro-magnetic control actuators are found to contribute significant damping due to a combination of eddy current and back electro-motive force (EMF) effects Uncertainties in both estimated physical parameters and modal behavior variables are given

Medical diagnosis system

Abstract: PURPOSE:To increase the quantity of information for medical diagnosis and to secure more highly accurate diagnosis by writing the individual identification data and the test data to a memory card at a hospital and also writing other data to the card at a patient private house. CONSTITUTION:The individual identification data are written to a memory card 15 at a hospital by a computer 10 and at the same time the test data on a biochemical test and other tests are also written successively to the card 15. While a paitient receives the card 15 written at the hospital side and performs periodically an everyday test at his/her own home to write these everyday test data including the blood pressure, etc., onto the card 15. Such a card 15 is read by the computer 10 at the hospital and the card contents are displayed on a CRT 12. As a result, a doctor can also know the transition of the blood pressure, etc., checked at the patient own home is addition to various check data obtained at the hospital. Thus the medical diagnosis is secured with higher accuracy.

Identification of material constants for a composite shell structure

Abstract: One of the basic requirements of an engineering analysis is the development of an adequate mathematical model describing the system. Frequently, comparisons with test data are used as a measure of the model's adequacy, or the test data are directly used to update or modify the model. For nonmetallic structures, the modeling task is often more difficult due to uncertainties in the elastic constants. System identification provides a methodology for systematically updating the mathematical model for improved correlation with test data. In this work a finite element model of a composite shell was created. The model includes uncertain orthotropic elastic constants. To identify these constants, a modal survey was performed on an actual shell. The resulting modal data along with the finite element model of the shell were used in a Bayes estimation algorithm. Values of the elastic constants were estimated which minimized the differences between the test results and the finite element predictions. The estimation procedure employed the concept of successive linearization to obtain an approximate solution to the original nonlinear estimation problem.

New Test Data on the Capacity of Cement-Filled Steel Tubulars

Abstract: This paper presents new test data in an area which is receiving considerable attention at present. The design data are applicable to new platforms and could lead to cost savings. They are also relevant to the repair and strengthening of existing structures worldwide.

Application of rock hardness and abrasive indexing to rock excavating equipment selection

Abstract: The work carried out in this thesis outlines some of the problems associated with abrasive wear in machines and other mechanical equipment used to excavate or process natural rock material. It has been stated that if the problems associated with abrasion are to be better understood, then a sound knowledge of the abrasive potential of rocks is essential. A number of common wear mechanisms are described together with existing hardness and abrasive tests. The author has investigated rock hardness and abrasiveness by the use of existing methods and subsequently, developed new correlated with the well tests which can be established methods of determining physical and mechanical properties of rock. A project on hard rock drilling has been conducted to determine the rate of wear on expensive diamond impregnated coring drill bits. A detailed investigation which involved the design and manufacture of special measuring equipment to accurately measure and record changes in the profile shape of the bit during its life span. This has permitted a study of the wear characteristics related to the various drilling parameters employed. A collaborative project was carried out with DeBeers, UK, to attempt to discover methods of predicting the rate of specific wear on diamond impregnated saw blades and the cutting forces required with the sawing of hard stone materials. This project has led to a new statistical approach to the analysis of the acquired test data for this purpose. A number of case histories have been discussed and recommendations made. As a result of these investigations together with the work covered in this thesis, the author has developed two new abrasive tests. These tests can be used to test materials such as unconsolidated rocks which otherwise, could not be satisfactorily tested by the established tests already in existence. The new tests have been tried and proved by correlating the test data by combining multiple regression analysis with the results obtained from physical and petrological rock property tests with actual rock cutting data. Conclusions have been drawn and recommendations for future work suggested.

Investigation of dynamic ground effect

Abstract: An experimental investigation of dynamic ground effect was conducted in the Univ. of Kansas wind tunnel using delta wings of 60, 70, 75 deg sweep; the XB-70 wing; and the F-104A wing. Both static and dynamic tests were made. Test data were compared to other test data, including dynamic flight test data of the XB-70 and F-104A. Limited flow visualization test were conducted. A significant dynamic effect was found for highly swept delta wings.

Seismic fragility of nuclear power plant components: Phase 2, Motor control center, switchboard, panelboard and power supply

Abstract: In Phase I of the Component Fragility Program, Brookhaven National Laboratory (BNL) has developed a procedure to establish the seismic fragility of nuclear power plant equipment by use of existing test data and demonstrated its application by considering two equipment pieces. In Phase II of the program, BNL has collected additional test data, and has further advanced and is applying the methodology to determine the fragility levels of selected essential equipment categories. The data evaluation of four equipment families, namely, motor control center, switchboard, panelboard and power supply has been completed. Fragility levels have been determined for various failure modes of each equipment class and the deterministic results are presented in terms of test response spectra. In addition, the test data have been analyzed for determination of the respective probabilistic fragility levels. To this end, a single g-value has been selected to approximately represent the test vibration level and a statistical analysis has been performed with the g-values corresponding to a particular failure mode. The zero period acceleration and the average spectral acceleration over a frequency range of interest are separately used as the single g-value. The resulting parameters are presented in terms of a median value, an uncertainty coefficientmore » and a randomness coefficient. Ultimately, each fragility level is expressed in terms of a single descriptor called an HCLPF value corresponding to a high (95%) confidence of a low (5%) probability of failure. The important observations made in the process of data analysis are included in this report.« less

Bit-error-rate testing of high-power 30-GHz traveling-wave tubes for ground-terminal applications

Abstract: Tests were conducted at NASA Lewis to measure the bit-error-rate performance of two 30-GHz 200-W coupled-cavity traveling-wave tubes (TWT's). The transmission effects of each TWT on a band-limited 220-Mbit/s SMSK signal were investigated. The tests relied on the use of a recently developed digital simulation and evaluation system constructed at Lewis as part ot the 30/20-GHz technology development program. This paper describes the approach taken to test the 30-GHz tubes and discusses the test data. A description of the bit-error-rate measurement system and the adaptations needed to facilitate TWT testing are also presented. A more comprehensive discussion of this topic appears in NASA publication TP-2635 [1].

Semiconductor memory checking system

Abstract: PURPOSE: To eliminate such a malfunction that outputs from respective memory cell blocks are fixed in the same value, and to eliminate an inter-bit interference by dividing the whole semiconductor memory into the plural memory cells and testing by supplying the blocks with data obtained by a circuit function switching signal CONSTITUTION: When the system enters the test mode, test data (a) is latched in a data conversion circuit DC1, and test data bi(i=1W6) determined by a circuit function switching signal (f) is generated, and written respectively in the memory blocks Mi To check the normality/abnormality of a memory cell, data Ci read out from the block Mi is converted to data di in a data conversion circuit DC2, then the data di is checked in a signal coincidence detection circuit CH, and the result of this detection is obtained as an output signal (e) The data conversion function of the circuit DC2 can be switched by the signal (f) similarly with the circuit DC1 COPYRIGHT: (C)1989,JPO&Japio