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A. Gagnaire
Researcher at École centrale de Lyon
Publications - 22
Citations - 625
A. Gagnaire is an academic researcher from École centrale de Lyon. The author has contributed to research in topics: Ellipsometry & Silicon. The author has an hindex of 12, co-authored 22 publications receiving 605 citations.
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The effects of polarization of the incident light-modeling and analysis of a SPR multimode optical fiber sensor
TL;DR: In this paper, a 3D skew ray modeling has been developed to consistently explain the experimental phenomena for an intrinsic SPR multimode optical fiber sensor, and the effects of the polarization direction of the incident light at certain conditions have been clarified.
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Ellipsometric study of silicon nanocrystal optical constants
TL;DR: In this article, two dispersion models were used to describe the silicon nanocrystal optical properties: the Bruggeman effective medium approximation model and the Tauc-Lorentz model.
Journal ArticleDOI
Densification and aging of ZrO2 films prepared by sol–gel
R. Brenier,A. Gagnaire +1 more
TL;DR: In this paper, it was shown that the tensile stress is limited by viscous flow accompanying densification, and that the main organic compounds reducing the rate of condensation reactions are acetate groups.
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Physical properties and photocatalytic efficiencies of TiO2 films prepared by PECVD and sol–gel methods
TL;DR: In this paper, the influence of the addition of a polymer and of a highly viscous solvent on physical properties (thickness, crystallite size and porosity) of TiO 2 thin films and on their photocatalytic efficiency was evaluated.
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Physicochemical characterization of covalently bonded alkyl monolayers on silica surfaces
Yolanda Duvault,A. Gagnaire,Francoise. Gardies,Nicole Jaffrezic-Renault,Claude Martelet,Dominique Morel,J. Serpinet,Jean-Louis Duvault +7 more
TL;DR: The physicochemical properties of silica surfaces covalently bonded with alkyl monolayers, in a chain length range from C6 to C22, were investigated by using chromatographic, ellipsometric and capacitance measurements as mentioned in this paper.