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Abhishek Kumar Jha
Researcher at Gdańsk University of Technology
Publications - 75
Citations - 1731
Abhishek Kumar Jha is an academic researcher from Gdańsk University of Technology. The author has contributed to research in topics: Microstrip & Permittivity. The author has an hindex of 18, co-authored 71 publications receiving 1130 citations. Previous affiliations of Abhishek Kumar Jha include Academy of Sciences of the Czech Republic & Indian Institute of Technology Dhanbad.
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Design and Application of the CSRR-Based Planar Sensor for Noninvasive Measurement of Complex Permittivity
TL;DR: In this paper, a microwave noninvasive planar sensor based on the complementary split ring resonator (CSRR) is proposed for an accurate measurement of the complex permittivity of materials.
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Genetically modified crops: current status and future prospects
Krishan Kumar,Geetika Gambhir,Abhishek Dass,Amit K. Tripathi,Alla Singh,Abhishek Kumar Jha,Pranjal Yadava,Mukesh Choudhary,Sujay Rakshit +8 more
TL;DR: A comprehensive update on the current status of the genetically modified (GM) crops under cultivation is presented and it is expected that such crops might achieve higher consumer acceptance as compared to the transgenic crops and would get faster regulatory approvals.
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Affine theorem for two-dimensional Fourier transform
TL;DR: In this paper, the Fourier transform becomes an affine co-ordinate transformation when the function domain is subjected to an affinities transformation, and the full theorem contains a variety of simpler theorems as special cases.
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A Generalized Rectangular Cavity Approach for Determination of Complex Permittivity of Materials
TL;DR: A novel cavity-based unified approach to measure the complex permittivity of dielectric samples placed in the E-plane of a rectangular cavity is presented, which is validated by designing two rectangular cavities having different slot sizes operating in the TE107 mode.
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Multi-Band RF Planar Sensor Using Complementary Split Ring Resonator for Testing of Dielectric Materials
TL;DR: In this paper, a multi-band RF planar sensor is proposed for non-destructive testing of dispersive materials, which is based on a number of complementary split ring resonator (CSRR) unit cells etched in the ground plane of the microstrip line.