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Adrian E. Ong

Researcher at Samsung

Publications -  24
Citations -  1373

Adrian E. Ong is an academic researcher from Samsung. The author has contributed to research in topics: Spin-transfer torque & Magnetoresistive random-access memory. The author has an hindex of 11, co-authored 24 publications receiving 1125 citations.

Papers
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Journal ArticleDOI

Basic principles of STT-MRAM cell operation in memory arrays

TL;DR: The fundamental physical principles of STT-MRAM operation are discussed, covering the range from device level to chip array performance, and methodology for its development.
Journal ArticleDOI

Spin-transfer torque magnetic random access memory (STT-MRAM)

TL;DR: It is shown that in-plane STT-MRAM technology, particularly the DMTJ design, is a mature technology that meets all conventional requirements for an STT -MRAM cell to be a nonvolatile solution matching DRAM and/or SRAM drive circuitry.
Proceedings ArticleDOI

Fully integrated 54nm STT-RAM with the smallest bit cell dimension for high density memory application

TL;DR: In this article, a spin-transfer torque-RAM with a 14F2 cell was integrated using modified DRAM processes at the 54nm technology node, and the basic switching performance (R-H and R-V) of the MTJ and current drivability of the access transistors were characterized at the single bit cell level.
Proceedings ArticleDOI

Latest Advances and Roadmap for In-Plane and Perpendicular STT-RAM

TL;DR: In this paper, the authors present the latest advances in in in-plane and perpendicular STT-RAM development and outline STTRAM's future prospects, applications, and roadmap.