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Spin-transfer torque magnetic random access memory (STT-MRAM)

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TLDR
It is shown that in-plane STT-MRAM technology, particularly the DMTJ design, is a mature technology that meets all conventional requirements for an STT -MRAM cell to be a nonvolatile solution matching DRAM and/or SRAM drive circuitry.
Abstract
Spin-transfer torque magnetic random access memory (STT-MRAM) is a novel, magnetic memory technology that leverages the base platform established by an existing 100pnm node memory product called MRAM to enable a scalable nonvolatile memory solution for advanced process nodes. STT-MRAM features fast read and write times, small cell sizes of 6F2 and potentially even smaller, and compatibility with existing DRAM and SRAM architecture with relatively small associated cost added. STT-MRAM is essentially a magnetic multilayer resistive element cell that is fabricated as an additional metal layer on top of conventional CMOS access transistors. In this review we give an overview of the existing STT-MRAM technologies currently in research and development across the world, as well as some specific discussion of results obtained at Grandis and with our foundry partners. We will show that in-plane STT-MRAM technology, particularly the DMTJ design, is a mature technology that meets all conventional requirements for an STT-MRAM cell to be a nonvolatile solution matching DRAM and/or SRAM drive circuitry. Exciting recent developments in perpendicular STT-MRAM also indicate that this type of STT-MRAM technology may reach maturity faster than expected, allowing even smaller cell size and product introduction at smaller nodes.

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Citations
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Journal ArticleDOI

Overview of emerging nonvolatile memory technologies

TL;DR: This review is devoted to the rapidly developing new class of memory technologies and scaling of scientific procedures based on an investigation of recent progress in advanced Flash memory devices.
Journal ArticleDOI

Basic principles of STT-MRAM cell operation in memory arrays

TL;DR: The fundamental physical principles of STT-MRAM operation are discussed, covering the range from device level to chip array performance, and methodology for its development.
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In-Memory Big Data Management and Processing: A Survey

TL;DR: This survey aims to provide a thorough review of a wide range of in-memory data management and processing proposals and systems, including both data storage systems and data processing frameworks.
Journal ArticleDOI

Magnetoresistive Random Access Memory

TL;DR: A review of the developments in MRAM technology over the past 20 years is presented with a particular focus on spin-transfer torque MRAM (STT-MRAM) which is currently receiving the greatest attention.
Journal ArticleDOI

Field-free magnetization reversal by spin-Hall effect and exchange bias.

TL;DR: An in-plane exchange bias is created and shown to enable field-free S HE-driven magnetization reversal of a perpendicularly magnetized Pt/Co/IrMn structure.
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TL;DR: Inter interfacial perpendicular anisotropy between the ferromagnetic electrodes and the tunnel barrier of the MTJ is used by employing the material combination of CoFeB-MgO, a system widely adopted to produce a giant tunnel magnetoresistance ratio in MTJs with in-plane an isotropy.
Journal ArticleDOI

Giant room-temperature magnetoresistance in single-crystal Fe/MgO/Fe magnetic tunnel junctions

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