A
Alain Levasseur
Researcher at University of Bordeaux
Publications - 133
Citations - 5642
Alain Levasseur is an academic researcher from University of Bordeaux. The author has contributed to research in topics: Thin film & Lithium. The author has an hindex of 33, co-authored 133 publications receiving 5017 citations. Previous affiliations of Alain Levasseur include École Normale Supérieure & École nationale supérieure de chimie et de physique de Bordeaux.
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Brillouin and raman scattering study of borate glasses
TL;DR: In this article, light scattering results obtained from Brillouin and Raman scattering experiments in a series of B 2 O 3 − x M 2 O glasses (M Li, Na, K, Rb, Cs and Tl) were extracted.
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Investigation of the local structure of LiPON thin films to better understand the role of nitrogen on their performance
Benoit Fleutot,Benoit Fleutot,Brigitte Pecquenard,Hervé Martinez,M. Letellier,Alain Levasseur +5 more
TL;DR: Amorphous thin solid films of lithium phosphorus oxynitride (LiPON) were prepared by radiofrequency sputtering from a Li 3 PO 4 target by varying nitrogen flow rate as mentioned in this paper.
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X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films
L. Benoist,Danielle Gonbeau,Geneviève Pfister-Guillouzo,E. Schmidt,G. Meunier,Alain Levasseur +5 more
TL;DR: In this article, new amorphous molybdenum oxysulfide thin films, prepared by r.f. magnetron sputtering and which could be used as positive electrode materials in microbatteries, were analyzed by X-ray photoelectron spectroscopy.
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An infrared and Raman study of new lonic-conductor lithium glasses
TL;DR: In this article, new vitreous fast ionic conductors in the system B2O3, Li2O, and LiCl are described, and a Raman and infrared study undertaken to elucidate the structure of the glasses and the conduction mechanism indicates that the structure consists of a "covalent" boron-oxygen network, in which LiCl is diluted without producing detectable interactions with the latter.
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Amorphous oxysulfide thin films MOySz (M=W, Mo, Ti) XPS characterization: structural and electronic pecularities
TL;DR: In this paper, the XPS study of different amorphous oxysulfides thin films MOySz (M=W, Ti, Mo), prepared by radio frequency magnetron sputtering, has been conducted.