A
Albert J. P. Theuwissen
Researcher at Delft University of Technology
Publications - 158
Citations - 3041
Albert J. P. Theuwissen is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Image sensor & CMOS. The author has an hindex of 28, co-authored 155 publications receiving 2759 citations. Previous affiliations of Albert J. P. Theuwissen include Rochester Institute of Technology & NXP Semiconductors.
Papers
More filters
Book
Solid-State Imaging with Charge-Coupled Devices
TL;DR: In this paper, the authors present a reference record created on 2005-11-18, modified on 2016-08-08 and used for the purpose of visualisation of video applications.
Journal ArticleDOI
Multiple-Ramp Column-Parallel ADC Architectures for CMOS Image Sensors
TL;DR: A CMOS imager with a column-parallel ADC architecture based on a multiple-ramp single-slope (MRSS) ADC that can be easily adapted to exhibit a companding characteristic, which exploits the amplitude-dependent nature of the photon shot noise present in imager signals.
Journal ArticleDOI
An image sensor which captures 100 consecutive frames at 1000000 frames/s
Takeharu Etoh,D. Poggemann,G. Kreider,Hideki Mutoh,Albert J. P. Theuwissen,Arno Ruckelshausen,Yasushi Kondo,Hiromasa Maruno,Kenji Takubo,Hideki Soya,K. Takehara,Tomoo Okinaka,Yasuhide Takano +12 more
TL;DR: Some innovative technologies were introduced to achieve ultrahigh performance, including slanted linear CCD in situ storage, curving design procedure, and a CCD switch with fewer metal shunting wires.
Journal ArticleDOI
CMOS image sensors: State-of-the-art
TL;DR: In this paper, the authors give an overview of the state-of-the-art of CMOS image sensors and the main focus is put on the shrinkage of the pixels: what is the effect on the performance characteristics of the imagers and on the various physical parameters of the camera?
Journal ArticleDOI
Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
N.V. Loukianova,H.O. Folkerts,J.P. Maas,D.W.E. Verbugt,A.J. Mierop,W. Hoekstra,E. Roks,Albert J. P. Theuwissen +7 more
TL;DR: In this paper, the authors present an extensive study of leakage current mechanisms in diodes to model the dark current of various pixel architectures for active pixel CMOS image sensors, and find that the main part of the total dark current comes from the depletion of the photodiode edge at the surface.