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Anders Hoel

Researcher at Uppsala University

Publications -  28
Citations -  1665

Anders Hoel is an academic researcher from Uppsala University. The author has contributed to research in topics: Nanocrystalline material & Thin film. The author has an hindex of 17, co-authored 28 publications receiving 1595 citations. Previous affiliations of Anders Hoel include University of Nairobi.

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Photoelectrochemical and Optical Properties of Nitrogen Doped Titanium Dioxide Films Prepared by Reactive DC Magnetron Sputtering

TL;DR: In this paper, Nanocrystalline porous porous nitrogen doped titanium dioxide (TiO2) thin films were prepared by DC magnetron sputtering and characterized by X-ray diffraction, scanning electron microscopy, and optical and photoelectrochemical (PEC) measurements.
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Electrical and optical properties of thin films consisting of tin-doped indium oxide nanoparticles

TL;DR: In this article, the effects of annealing on the ITO nanoparticles were investigated by analyzing the spectral optical reflectance and transmittance using effective medium theory and accounting for ionized impurity scattering.
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Low-level detection of ethanol and H2S with temperature-modulated WO3 nanoparticle gas sensors

TL;DR: Low-Level Detection of Ethanol and H2S with Temperature-Modulated WO3 Nanoparticle Gas Sensors as discussed by the authors was the first low-level detection of ethanol and h2S.
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Gas sensor response of pure and activated WO3 nanoparticle films made by advanced reactive gas deposition

TL;DR: In this article, pure and activated (doped) nanocrystalline WO 3 films, produced by advanced reactive gas deposition, were investigated for gas sensing applications, and the sensitivity was found to lie below and around the ppm level for H 2 S, CO, and NO 2, respectively.
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Photoelectrochemical study of sputtered nitrogen-doped titanium dioxide thin films in aqueous electrolyte

TL;DR: In this paper, a study of spattered Nitrogen-doped Titanium Dioxide thin film in aqueous electrolyte was conducted in order to study the properties of the thin film.