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Andreas Graff
Researcher at Fraunhofer Society
Publications - 53
Citations - 1005
Andreas Graff is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Silicon & High-electron-mobility transistor. The author has an hindex of 12, co-authored 53 publications receiving 808 citations.
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Journal ArticleDOI
Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells
Volker Naumann,Dominik Lausch,Angelika Hähnel,J. Bauer,Otwin Breitenstein,Andreas Graff,Martina Werner,S. Swatek,Stephan Großer,Jörg Bagdahn,Christian Hagendorf +10 more
TL;DR: In this article, a model for the shunting mechanism in PID-s affected solar cells is developed and the results of different shunting mechanisms are discussed with respect to different shunt mechanisms.
Journal ArticleDOI
Potential-Induced Degradation (PID): Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination
Dominik Lausch,Volker Naumann,Otwin Breitenstein,J. Bauer,Andreas Graff,J. Bagdahn,Christian Hagendorf +6 more
TL;DR: In this article, the authors introduced a potential-induced degradation (PID) test at a solar-cell level and for individual module components applicable as a tool for process control in industries and root cause analyses in science departments.
Journal ArticleDOI
The role of stacking faults for the formation of shunts during potential-induced degradation of crystalline Si solar cells
Volker Naumann,Dominik Lausch,Andreas Graff,Martina Werner,S. Swatek,J. Bauer,Angelika Hähnel,Otwin Breitenstein,Stephan Großer,Jörg Bagdahn,Christian Hagendorf +10 more
TL;DR: In this paper, a linear shape signature is found in plan-view EBIC images at every potential-induced shunt position on both mono and multicrystalline solar cells.
Journal ArticleDOI
Sodium Outdiffusion from Stacking Faults as Root Cause for the Recovery Process of Potential-induced Degradation (PID)
Dominik Lausch,Volker Naumann,Andreas Graff,Angelika Hähnel,Otwin Breitenstein,Christian Hagendorf,Jörg Bagdahn +6 more
TL;DR: In this article, a thermal and electrical recovery of potential-induced degradation (PID) in solar cells was performed by in-situ thermal recovery and subsequent microscopic investigations, and it was shown that Na decorated stacking faults are responsible for PID.