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Andrej Yu. Kuznetsov

Researcher at University of Oslo

Publications -  127
Citations -  2622

Andrej Yu. Kuznetsov is an academic researcher from University of Oslo. The author has contributed to research in topics: Thin film & Chemistry. The author has an hindex of 23, co-authored 113 publications receiving 2195 citations.

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Journal ArticleDOI

Correlations of thermal properties with grain structure, morphology, and defect balance in nanoscale polycrystalline ZnO films

TL;DR: In this paper, two sets of ZnO thin films grown by atomic layer deposition method were investigated to analyse the correlation between morphology, chemical defects and thermal properties, showing that the increase in thickness for the samples grown at 200°C was accompanied with a continuous shift to Zn-rich conditions and corresponding increase in the thermal conductivity.
Book ChapterDOI

Bulk Growth and Impurities

TL;DR: In this article, the authors have reviewed selected aspects of bulk single crystal growth of ZnO, including growth from the melt, hydrothermal, and chemical vapor transport methods.
Journal ArticleDOI

Optical and morphological features of bulk and homoepitaxial ZnO

TL;DR: In this paper, the authors investigated the free exciton nophonon lines and their relationship with the crystal-field split-off counterpart of the valence band in ZnO substrate crystals.
Journal ArticleDOI

Tunneling in ZnO/ZnCdO quantum wells towards next generation photovoltaic cells

TL;DR: In this article, structural and photoluminescence properties of ZnO-based multiple quantum wells (MQWs) by metal organic vapor phase epitaxy were investigated and the observed spectral and carrier lifetime variations were discussed in terms of quantum confinement and internal electric field modulation.
Journal ArticleDOI

Radiation-induced defect accumulation and annealing in Si-implanted gallium oxide

TL;DR: In this paper , defect accumulation and annealing phenomena in Si-implanted monoclinic gallium oxide (β-Ga2O3) wafers, having different surface orientations, were studied by Rutherford backscattering spectrometry in channeling mode (RBS/c), x-ray diffraction (XRD), and (scanning) transmission electron microscopy [(S)TEM).