High-performance parallel computer architecture and systems have been improved at a phenomenal rate. In the meantime, VLSI computer-aided design (CAD) software for multibillion-transistor IC design has become increasingly complex and requires prohibitively high computational resources. Recent studies have shown that, numerous CAD problems, with their high computational complexity, can greatly benefit from the fast-increasing parallel computation capabilities. However, parallel programming imposes big challenges for CAD applications. Fully exploiting the computational power of emerging general-purpose and domain-specific multicore/many-core processor systems, calls for fundamental research and engineering practice across every stage of parallel CAD design, from algorithm exploration, programming models, design-time and run-time environment, to CAD applications, such as verification, optimization, and simulation. This journal special section will cover recent progress on parallel CAD research, including algorithm foundations, programming models, parallel architectural-specific optimization, and verification. More specifically, papers with in-depth and extensive coverage of the following topics will be considered, as well as other topics relevant to the design of parallel CAD algorithms and software tools. 1. Parallel algorithm design and specification for CAD applications 2. Parallel programming models and languages of particular use in CAD 3. Runtime support and performance optimization for CAD applications 4. Parallel architecture-specific design and optimization for CAD applications 5. Parallel program debugging and verification techniques particularly relevant for CAD The papers should be submitted via the Manuscript Central website and should adhere to standard ACM TODAES formatting requirements (http://todaes.acm.org/). The page count limit is 25.

Parallel CAD: Algorithm Design and Programming Special Section Call for Papers TODAES: ACM Transactions on Design Automation of Electronic Systems

Routing layers are assigned to connection segments in integrated circuit design. A routing description that includes connection segments and a vertex where at least two of the connection segments connect to each other is obtained. A penalty is determined for the vertex based on a potential layer assignment combination for the connection segments that connect at the vertex, and routing layers are assigned to the connection segments based on the determined penalty.

Metal layer assignment

Early routability prediction helps designers and tools perform preventive measures so that design rule violations can be avoided in a proactive manner. However, it is a huge challenge to have a predictor that is both accurate and fast. In this work, we study how to leverage convolutional neural network to address this challenge. The proposed method, called RouteNet, can either evaluate the overall routability of cell placement solutions without global routing or predict the locations of DRC (Design Rule Checking) hotspots. In both cases, large macros in mixed-size designs are taken into consideration. Experiments on benchmark circuits show that RouteNet can forecast overall routability with accuracy similar to that of global router while using substantially less runtime. For DRC hotspot prediction, RouteNet improves accuracy by 50% compared to global routing. It also significantly outperforms other machine learning approaches such as support vector machine and logistic regression.

https://dl.acm.org/doi/pdf/10.1145/3240765.3240843

RouteNet: routability prediction for mixed-size designs using convolutional neural network

The ISPD~2015 placement-contest benchmarks include all the detailed pin, cell, and wire geometry constraints from the 2014 release, plus(a) added fence regions and placement blockages,(b) altered netlists including fixed macro blocks,(c) reduced standard cell area utilization via larger floorplan outlines, and(d)] specified upper limits on local cell-area density.Compared to the 2014 release, these new constraints add realism and increase the difficulty of producing detail-routable wirelength-driven placements.

ISPD 2015 Benchmarks with Fence Regions and Routing Blockages for Detailed-Routing-Driven Placement

Existing routability-driven placers mostly employ rudimentary and often crude congestion models that fail to account for the complexities in modern designs, e.g., the impact of non-uniform wiring stacks, layer directives, partial and/or complete routing blockages, etc. In addition, they are hampered by congestion metrics that do not accurately score or represent design congestion. This is in large part due to the non-availability of public designs depicting industrial wiring stacks and other complexities affecting design routability. The aim of the DAC 2012 routability-driven placement contest is to address these issues, by way of the following: (a) release challenging benchmark designs that are derived from modern industrial ASICs, and contain information to perform both placement and routing, (b) present a new congestion metric, as well as an accurate congestion analysis framework to evaluate and compare the routability of various placement algorithms. We hope that a set of challenging benchmarks, along with a standard, publicly available evaluation framework will further advance research in routability-driven placement.

The DAC 2012 routability-driven placement contest and benchmark suite

Industry routers are very complex and time consuming, and are becoming more so with the explosion in design rules and design for manufacturability requirements that multiply with each technology node. Global routing is just the first phase of a router and serves the dual purpose of (i) seeding the following phases of a router and (ii) evaluating whether the current design point is routable. Lately, it has become common to use a "light mode" version of the global router, similar to today's academic routers, to quickly evaluate the routability of a given placement. This use model suffers from two primary weaknesses: (i) it does not adequately model the local routing resources, while the model is important to remove opens and shorts and eliminate DRC violations, (ii) the metrics used to represent congestion are non-intuitive and often fail to pinpoint the key issues that need to be addressed. This paper presents solutions to both issues, and empirically demonstrates that incorporating the proposed solutions within a global routing based congestion analyzer yields a more accurate view of design routability.

/pdf/glare-global-and-local-wiring-aware-routability-evaluation-50zxjs0i0c.pdf

GLARE: global and local wiring aware routability evaluation

Local routing congestion is becoming increasingly important as complex design rules make local pin access the bottle-neck for modern designs and routers. Since congestion analysis based on global routing does not model these effects, routability-driven placement and physical synthesis fail to alleviate local congestion. This work models routing congestion at the placement level in order to apply local congestion mitigation. We propose a local congestion metric that computes a "routing-difficulty" score for every cell in the design library. To disperse local congestion, we apply a suite of detailed placement techniques called MILOR (Movement, cell Inflation and Legalization, and Optimization within a Row). Experimental results show that our techniques can significantly improve routing quality on real industry designs from 65, 45, and 32 nanometer technologies.

New placement prediction and mitigation techniques for local routing congestion

A integrated circuit (IC) chip with ESD robustness and the system and method of wiring the IC chip. Minimum wire width and maximum resistance constraints are applied to each of the chip's I/O ports. These constraints are propagated to the design. Array pads are wired to I/O cells located on the chip. Unused or floating pads may be tied to a power supply or ground line, either directly or through an electrostatic discharge (ESD) protect device. A multi-supply protect device (ESDxx) coupled between pairs of supplies and ground or to return lines is also included. Thus, wiring is such that wires and vias to ESD protect devices are wide enough to provide adequate ESD protection. Robust ESD protection is afforded all chip pads. The design may then be verified.

Method of automated design and checking for ESD robustness

Disclosed is a method of routing power from a power network to one or more power service terminals within a voltage island, comprising: dividing the power network into segments; creating power service terminal to segment connections based on a first set of criteria; removing selected power service terminal to segment connections based on a second set of criteria; and selecting one power service terminal to segment connection for each the power service terminal. The first criteria is includes power drop, wire length, wire size, wiring layer restrictions and the second criteria includes electro-migration, wire length and current criteria.

Method of wiring power service terminals to a power network in a semiconductor integrated circuit

Routing congestion has become a critical layout challenge in nanoscale circuits since it is a critical factor in determining the routability of a design. An unroutable design is not useful even though it closes on all other design metrics. Fast design closure can only be achieved by accurately evaluating whether a design is routable or not early in the design cycle. Lately, it has become common to use a “light mode” version of a global router to quickly evaluate the routability of a given placement. This approach suffers from three weaknesses: (i) it does not adequately model local routing resources, which can cause incorrect routability predictions that are only detected late, during detailed routing; (ii) the congestion maps obtained by it tend to have isolated hotspots surrounded by noncongested spots, called “noisy hotspots”, which further affects the accuracy in routability evaluation; and (iii) the metrics used to represent congestion may yield numbers that do not provide sufficient intuition to the designer, and moreover, they may often fail to predict the routability accurately. This article presents solutions to these issues. First, we propose three approaches to model local routing resources. Second, we propose a smoothing technique to reduce the number of noisy hotspots and obtain a more accurate routability evaluation result. Finally, we develop a new metric which represents congestion maps with higher fidelity. We apply the proposed techniques to several industrial circuits and demonstrate that one can better predict and evaluate design routability and that congestion mitigation tools can perform much better to improve the design routability.

/pdf/techniques-for-scalable-and-effective-routability-evaluation-1w1oaf4548.pdf

Andrew D. Huber

Papers

GLARE: global and local wiring aware routability evaluation

New placement prediction and mitigation techniques for local routing congestion

Method of automated design and checking for ESD robustness

Method of wiring power service terminals to a power network in a semiconductor integrated circuit

Techniques for scalable and effective routability evaluation