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Andrew Yacoot
Researcher at National Physical Laboratory
Publications - 70
Citations - 1486
Andrew Yacoot is an academic researcher from National Physical Laboratory. The author has contributed to research in topics: Interferometry & Metrology. The author has an hindex of 19, co-authored 63 publications receiving 1326 citations. Previous affiliations of Andrew Yacoot include University of London.
Papers
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Aspects of scanning force microscope probes and their effects on dimensional measurement
Andrew Yacoot,Ludger Koenders +1 more
TL;DR: In this article, the authors describe the various scanning probe microscopy tips and cantilevers used today for scanning force microscopy and magnetic force imaging, together with an overview of the various tip-sample interactions that affect dimensional measurements.
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Advances in Scanning Force Microscopy for Dimensional Metrology
TL;DR: In this paper, the state of the art in scanning force microscopy for dimensional metrology is described and a detailed description is given of the important factors affecting the major components of a scanning force microscope from the metrological point of view.
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Recent developments in dimensional nanometrology using AFMs
Andrew Yacoot,Ludger Koenders +1 more
TL;DR: In this paper, the authors present a brief overview of how this has been achieved, highlights the future requirements for metrology to support developments in AFM technology and describes work in progress to meet this need.
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Comparison of the performance of the next generation of optical interferometers
Marco Pisani,Andrew Yacoot,P. Balling,Nicola Bancone,Cengiz Birlikseven,Mehmet Celik,Jens Flügge,Ramiz Hamid,Paul Köchert,Petr Kren,Ulrich Kuetgens,Antti Lassila,Gian Bartolo Picotto,Ersoy Sahin,Jeremias Seppä,Matthew Tedaldi,Christoph Weichert +16 more
TL;DR: The results of a comparison of performance of the optical interferometers using an x-ray interferometer to generate traceable reference displacements are presented.
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The European nanometrology landscape
Richard Leach,Robert D. Boyd,Theresa Burke,Hans-Ulrich Danzebrink,Kai Dirscherl,Thorsten Dziomba,Mark Gee,Ludger Koenders,Valérie Morazzani,Allan Pidduck,Debdulal Roy,Wolfgang E. S. Unger,Andrew Yacoot +12 more
TL;DR: This review paper summarizes the European nanometrology landscape from a technical perspective with a review of current status, the capabilities and limitations of current techniques and instruments, and future directions being driven by emerging industrial measurement requirements.