A
Anna Pastuszczak
Researcher at University of Warsaw
Publications - 38
Citations - 316
Anna Pastuszczak is an academic researcher from University of Warsaw. The author has contributed to research in topics: Metamaterial & Compressed sensing. The author has an hindex of 10, co-authored 37 publications receiving 274 citations.
Papers
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Real-time single-pixel video imaging with Fourier domain regularization.
TL;DR: In this paper, a closed-form image reconstruction method for single-pixel imaging based on the generalized inverse of the measurement matrix is presented, which regularizes the inverse problem by minimizing the norms of the convolution between the reconstructed image and a set of spatial filters.
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Sub-wavelength diffraction-free imaging with low-loss metal-dielectric multilayers
TL;DR: In this paper, the authors demonstrate numerically the diffraction-free propagation of sub-wavelength sized optical beams through simple elements built of metal-dielectric multilayers.
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Optimized low-loss multilayers for imaging with sub-wavelength resolution in the visible wavelength range
Anna Pastuszczak,Rafal Kotynski +1 more
TL;DR: In this article, the effective skin-depth and resolution of Ag-TiO2, Ag-SrTiO3, and Ag-GaP multilayers for imaging with sub-wavelength resolution were optimized.
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Single-pixel imaging with Morlet wavelet correlated random patterns
TL;DR: In this paper, a sampling scheme based on a random selection of Morlet wavelets convolved with white noise is proposed to reduce the required signal acquisition time by using a novel sampling scheme, which maps the measured images accurately both in the spatial and spatial frequency domains.
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Sensitivity of imaging properties of metal-dielectric layered flat lens to fabrication inaccuracies
Rafal Kotynski,Hovik V. Baghdasaryan,Tomasz Stefaniuk,Anna Pastuszczak,Marian Marciniak,Andrei V. Lavrinenko,Krassimir Panajotov,Krassimir Panajotov,Tomasz Szoplik +8 more
TL;DR: In this article, the authors characterize the sensitivity of imaging properties of a layered silver-TiO2 flat lens to fabrication inaccuracies and show that the resolution and transmission efficiency are highly sensitive to small changes of layer thicknesses.