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Arne Hoehl
Researcher at German National Metrology Institute
Publications - 71
Citations - 1012
Arne Hoehl is an academic researcher from German National Metrology Institute. The author has contributed to research in topics: Synchrotron radiation & Metrology. The author has an hindex of 14, co-authored 64 publications receiving 811 citations.
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Journal ArticleDOI
Gas detectors for x-ray lasers
K. Tiedtke,Josef Feldhaus,U. Hahn,U. Jastrow,T. Nunez,Thomas Tschentscher,S. V. Bobashev,A. A. Sorokin,Jerome B. Hastings,S. Möller,L. Cibik,Alexander Gottwald,Arne Hoehl,Udo Kroth,Michael Krumrey,Hendrik Schöppe,Gerhard Ulm,M. Richter +17 more
TL;DR: In this article, the authors developed different types of photodetectors that are based on the photoionization of a gas at a low target density for online photon diagnostics at current and future x-ray free-electron laser facilities.
Journal ArticleDOI
Metrology Light Source: The first electron storage ring optimized for generating coherent THz radiation
J. Feikes,M. von Hartrott,Markus Ries,P.O.Schmid,Godehard Wüstefeld,Arne Hoehl,Roman Klein,R. Muller,Gerhard Ulm +8 more
TL;DR: The Metrology Light Source is a recently constructed 630 MeV electron storage ring, operating as a synchrotron radiation source for the THz to extreme UV spectral range as discussed by the authors.
Journal ArticleDOI
Near-field imaging and nano-Fourier-transform infrared spectroscopy using broadband synchrotron radiation
TL;DR: Scanning near-field optical microscopy with a spatial resolution below 100 nm is demonstrated by using low intensity broadband synchrotron radiation in the IR regime to perform nano-Fourier-transform infrared spectroscopy over a wide spectral range.
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Quasi-1D TiS3 Nanoribbons: Mechanical Exfoliation and Thickness-Dependent Raman Spectroscopy.
Alexey Lipatov,Michael J. Loes,Haidong Lu,Jun Dai,Piotr Patoka,Nataliia S. Vorobeva,Dmitry S. Muratov,Dmitry S. Muratov,Georg Ulrich,Georg Ulrich,Bernd Kästner,Arne Hoehl,Gerhard Ulm,Xiao Cheng Zeng,Eckart Rühl,Alexei Gruverman,Peter A. Dowben,Alexander Sinitskii +17 more
TL;DR: The conclusions established in this study can be extended to a variety of transition metal trichalcogenide materials as well as other quasi-1D crystals, and the possibility of exfoliation of TiS3 into narrow crystals with smooth edges could be important for the future realization of miniature device channels with reduced edge scattering of charge carriers.
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Operation of the Metrology Light Source as a primary radiation source standard
Roman Klein,G. Brandt,R. Fliegauf,Arne Hoehl,Ralph Müller,Reiner Thornagel,Gerhard Ulm,M. Abo-Bakr,J. Feikes,M. v. Hartrott,Karsten Holldack,Godehard Wüstefeld +11 more
TL;DR: The Metrology Light Source (MLS) as discussed by the authors is the electron storage ring of the Physikalisch-Technische Bundesanstalt (PTB) located in Berlin and is dedicated to metrology and technological developments in the UV and extreme UV spectral range as well as in the IR and THz region.