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Bernd Kästner
Researcher at German National Metrology Institute
Publications - 22
Citations - 380
Bernd Kästner is an academic researcher from German National Metrology Institute. The author has contributed to research in topics: Spectroscopy & Fourier transform infrared spectroscopy. The author has an hindex of 8, co-authored 20 publications receiving 278 citations.
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Journal ArticleDOI
Partitioning of on-demand electron pairs.
Niels Ubbelohde,Frank Hohls,Vyacheslavs Kashcheyevs,Timo Wagner,Lukas Fricke,Bernd Kästner,Klaus Pierz,Hans Werner Schumacher,Rolf J. Haug +8 more
TL;DR: Cooper pairs impinging stochastically at a mesoscopic beamsplitter have been successfully partitioned, as verified by measuring the coincidence of arrival, which opens a path to future on-demand generation of spin-entangled electron pairs from a suitably prepared two-electron quantum-dot ground state.
Journal ArticleDOI
Quasi-1D TiS3 Nanoribbons: Mechanical Exfoliation and Thickness-Dependent Raman Spectroscopy.
Alexey Lipatov,Michael J. Loes,Haidong Lu,Jun Dai,Piotr Patoka,Nataliia S. Vorobeva,Dmitry S. Muratov,Dmitry S. Muratov,Georg Ulrich,Georg Ulrich,Bernd Kästner,Arne Hoehl,Gerhard Ulm,Xiao Cheng Zeng,Eckart Rühl,Alexei Gruverman,Peter A. Dowben,Alexander Sinitskii +17 more
TL;DR: The conclusions established in this study can be extended to a variety of transition metal trichalcogenide materials as well as other quasi-1D crystals, and the possibility of exfoliation of TiS3 into narrow crystals with smooth edges could be important for the future realization of miniature device channels with reduced edge scattering of charge carriers.
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Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
Peter Hermann,Arne Hoehl,Georg Ulrich,Claudia Fleischmann,Antje Hermelink,Bernd Kästner,Piotr Patoka,Andrea Hornemann,Burkhard Beckhoff,Eckart Rühl,Gerhard Ulm +10 more
TL;DR: The application of scattering-type near-field optical microscopy to characterize various semiconducting materials using the electron storage ring Metrology Light Source (MLS) as a broadband synchrotron radiation source shows high sensitivity for spectroscopic material discrimination.
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Nanoscale plasmonic phenomena in CVD-grown MoS(2) monolayer revealed by ultra-broadband synchrotron radiation based nano-FTIR spectroscopy and near-field microscopy.
Piotr Patoka,Georg Ulrich,Ariana E. Nguyen,Ludwig Bartels,Peter A. Dowben,Volodymyr Turkowski,Talat S. Rahman,Peter Hermann,Bernd Kästner,Arne Hoehl,Gerhard Ulm,Eckart Rühl +11 more
TL;DR: The results reveal the capability of the s-SNOM technique to study local multiple excitations in complex non-homogeneous structures and reveal the plasmonic character of the MoS( 2) structures and their interaction with the SiO(2) phonons leading to an enhancement of the hybridized surface plasMon-phonon mode.
Journal ArticleDOI
Enhancing the sensitivity of nano-FTIR spectroscopy.
Peter Hermann,Bernd Kästner,Arne Hoehl,Vyacheslavs Kashcheyevs,Piotr Patoka,Georg Ulrich,J. Feikes,Markus Ries,Tobias Tydecks,Burkhard Beckhoff,Eckart Rühl,Gerhard Ulm +11 more
TL;DR: The influence of the properties of the radiation source, such as the electron bunch shape and spectral bandwidth of the emitted radiation, on near-field infrared spectra of silicon-carbide (SiC) is investigated to exploit the full potential of nano-FTIR spectroscopy.