scispace - formally typeset
P

Piotr Patoka

Researcher at Free University of Berlin

Publications -  23
Citations -  789

Piotr Patoka is an academic researcher from Free University of Berlin. The author has contributed to research in topics: Fourier transform infrared spectroscopy & Synchrotron radiation. The author has an hindex of 14, co-authored 22 publications receiving 676 citations. Previous affiliations of Piotr Patoka include University of Strasbourg & Helmholtz-Zentrum Berlin.

Papers
More filters
Journal ArticleDOI

Optical and Magnetic Properties of Hexagonal Arrays of Subwavelength Holes in Optically Thin Cobalt Films

TL;DR: Experimental results on the optical, magnetic, as well as magneto-optic properties of hexagonal arrays of subwavelength holes in optically thin cobalt films demonstrate the ability to artificially control the magnetic and thus the Magneto-Optic properties in hole array structures.
Journal ArticleDOI

Near-field imaging and nano-Fourier-transform infrared spectroscopy using broadband synchrotron radiation

TL;DR: Scanning near-field optical microscopy with a spatial resolution below 100 nm is demonstrated by using low intensity broadband synchrotron radiation in the IR regime to perform nano-Fourier-transform infrared spectroscopy over a wide spectral range.
Journal ArticleDOI

Quasi-1D TiS3 Nanoribbons: Mechanical Exfoliation and Thickness-Dependent Raman Spectroscopy.

TL;DR: The conclusions established in this study can be extended to a variety of transition metal trichalcogenide materials as well as other quasi-1D crystals, and the possibility of exfoliation of TiS3 into narrow crystals with smooth edges could be important for the future realization of miniature device channels with reduced edge scattering of charge carriers.
Journal ArticleDOI

Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy

TL;DR: The application of scattering-type near-field optical microscopy to characterize various semiconducting materials using the electron storage ring Metrology Light Source (MLS) as a broadband synchrotron radiation source shows high sensitivity for spectroscopic material discrimination.