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Arun Kumar

Researcher at Amity University

Publications -  51
Citations -  554

Arun Kumar is an academic researcher from Amity University. The author has contributed to research in topics: Thin film & Antenna (radio). The author has an hindex of 10, co-authored 50 publications receiving 322 citations. Previous affiliations of Arun Kumar include Olivetti & University of Verona.

Papers
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Sunlight-activated Eu2+/Dy3+ doped SrAl2O4 water resistant phosphorescent layer for optical displays and defence applications

TL;DR: In this article, the authors introduced a strategy for the fabrication of a sunlight-activated green luminescent Eu2+/Dy3+ doped strontium aluminate (Sr1−x−yAl2O4:Eux2+ /Dyy3+) assisted long persistent, transparent, flexible and water resistant phosphorescent layer via a customized solid state reaction-solution casting method.
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A commercial approach for the fabrication of bulk and nano phosphors converted into highly efficient white LEDs

TL;DR: In this article, a strategy to synthesize a highly efficient yellow light emitting Y3−xAl5O12:Cex (x = 0.03 to 0.3) based bulk as well as nano (rod-shaped) phosphors, which are the main component of solid state white light-emitting diodes (WLEDs), was reported.
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SnS Thin Film Solar Cells: Perspectives and Limitations

TL;DR: In this article, the limitations of SnS deposition in terms of reproducibility and reliability were analyzed by X-ray diffraction, Raman spectroscopy, scanning electron microscopy, and atomic force microscopy.
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Influence of deposition time on the properties of ZnS/p-Si heterostructures

TL;DR: In this article, the structural, morphological and optical properties of ZnS/p-Si heterostructures have been thoroughly investigated using X-ray diffraction, x-ray photoelectron spectroscopy, scanning electron microscopy, UV-visible and photoluminescence spectrography.
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Highly responsive and low-cost ultraviolet sensor based on ZnS/p-Si heterojunction grown by chemical bath deposition

TL;DR: In this paper, nanocrystalline ZnS thin films were deposited on p-Si substrates, and the crystalline quality of the as-deposited thin films was studied using X-ray diffraction and scanning transmission electron microscopy (STEM).