C
C. Frost
Researcher at Science and Technology Facilities Council
Publications - 18
Citations - 220
C. Frost is an academic researcher from Science and Technology Facilities Council. The author has contributed to research in topics: Neutron & Neutron temperature. The author has an hindex of 6, co-authored 18 publications receiving 147 citations.
Papers
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Journal ArticleDOI
Selective Hardening for Neural Networks in FPGAs
TL;DR: This paper evaluates the effects of radiation-induced errors in the output correctness of two neural networks implemented in static random-access memory-based FPGAs and proposes a selective hardening strategy that triplicates only the most vulnerable layers of the neural network.
Journal ArticleDOI
Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs
Laércio Lima Pilla,Paolo Rech,Francesco Silvestri,C. Frost,Philippe O. A. Navaux,M. Sonza Reorda,Luigi Carro +6 more
TL;DR: The neutron sensitivity of Graphics Processing Units (GPUs) when executing a Fast Fourier Transform (FFT) algorithm is assessed, and specific software-based hardening strategies to reduce its failure rate are proposed.
Journal ArticleDOI
Charge-Collection and Single-Event Upset Measurements at the ISIS Neutron Source
TL;DR: In this paper, the effects of low-energy neutrons on a commercial CCD contaminated with traces of 10B are described, and the implications for testing protocols and instrument design are discussed.
Proceedings ArticleDOI
Neutron-Induced Soft Errors in Graphic Processing Units
Paolo Rech,C. Aguiar,Ronaldo Rodrigues Ferreira,Marco Silvestri,Alessio Griffoni,C. Frost,Luigi Carro +6 more
TL;DR: The matrix multiplication application error rate is evaluated, the internal memory resources cross sections are measured, and a new threads cross section is defined to characterize the computing units sensitivity to radiation.
Journal ArticleDOI
High-Energy Versus Thermal Neutron Contribution to Processor and Memory Error Rates
Daniel Oliveira,Fernando Fernandes dos Santos,Gabriel Piscoya Davila,Carlo Cazzaniga,C. Frost,Robert Baumann,Paolo Rech +6 more
TL;DR: In this paper, the results of accelerated radiation testing on an AMD accelerated processing unit, three Nvidia graphic processing units, an Intel accelerator, a field-programmable gate array, and two double-data-rate memories under thermal and high-energy neutrons separately were presented.